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Structural Properties of Pdxs/V Multilayer thin Films

Published online by Cambridge University Press:  25 February 2011

G. D. Lewen
Affiliation:
Department of Physics, Arizona State University, Tempe, AZ 85287
M. B. Stearns
Affiliation:
Department of Physics, Arizona State University, Tempe, AZ 85287
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Abstract

The structures of e-beam evaporated Pd/V multilayer thin films have been studied under various film growth conditions. Both the deposition rate and the substrate temperature were varied in an e-beam source UHV deposition system, and the films were subsequently characterized by xray scattering and cross-sectional TEM.

Type
Research Article
Copyright
Copyright © Materials Research Society 1991

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References

REFERENCES

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