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Structural, Optical and Electrical Characterization of Thermally Evaporated TlBr Thin Films

  • Natália Destefano (a1) and Marcelo Mulato (a2)

Abstract

This paper presents the study related to the production of TlBr thin films. Films produced by thermal evaporation present better structural properties than those produced by spray pyrolysis. The main XRD peak of the evaporated films correspond to the (100) plane, whose structure is columnar as revealed by cross section SEM. The thickness decreases with increasing deposition height. Optical band gap of 3.0 eV and electrical resistivities about 109 Ωcm were obtained. EDS reveals a reduction in the amount of Br in the final films. One order of magnitude was obtained for the photo-to-dark current ratio when irradiation in the medical diagnosis X-ray mammography energy range was used.

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Keywords

Structural, Optical and Electrical Characterization of Thermally Evaporated TlBr Thin Films

  • Natália Destefano (a1) and Marcelo Mulato (a2)

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