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Structural Characterization of a Functionalized Organic Semiconductor

  • Melissa Stickle (a1), Refik Kortan (a1), Sandrine Rivillon (a2), Zhenan Bao (a3), Howard Katz (a4) and Yves Chabal (a1) (a2)...

Abstract

We report the structure of 5,5′-bis(4-hydroxyhexylphenyl)-2,2′-bithiophene (HO6PTTP60H) powder and sublimated films studied by X-ray diffraction (XRD) and Infrared absorption spectroscopy (IRAS). From XRD, herringbone packing is observed for the HO6PTTP60H powder. Different layer spacing is found for the powder (33.1Å) and the sublimated film (26.5Å). This slight difference indicates that the HO6PTTP60H molecule is tilted in the film. IRAS results confirm the presence of the HO6PTTP6OH molecule on the surface and its good stability over a few days.

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