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Structural and dielectric properties of Ca1-x MgxCu3Ti4O12 thin films

  • L. A. Bermúdez (a1), R. P. Guzman (a1), M.S. Tomar (a1) and R.E. Melgarejo (a1)

Abstract

Ca1-xMgxCu3Ti4O12 material has been synthesized by chemical route for different compositions and thin films have been deposited by spin coating. X-ray diffraction and Raman spectroscopy were used for detailed characterization of this material for both powder and thin films. X-ray diffraction shows single phase film material for different compositions x < 0.80. The initial measurements on dielectric response indicates high dielectric constant > 10, 000 for the composition x = 0.1.

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Structural and dielectric properties of Ca1-x MgxCu3Ti4O12 thin films

  • L. A. Bermúdez (a1), R. P. Guzman (a1), M.S. Tomar (a1) and R.E. Melgarejo (a1)

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