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Structrual Characterization and Raman Scattering of Epitaxial Aluminum Nitride Thin Films on Si(111)
Published online by Cambridge University Press: 25 February 2011
Abstract
Thin films of aluminum nitride were grown epitaxially on Si(111) by ultra-high-vacuum dc magnetron reactive sputter deposition. Epitaxy was achieved at substrate temperatures of 600° C or above. We report results of film characterization by x-ray diffraction, transmission electron microscopy, and Raman scattering.
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- Copyright © Materials Research Society 1992
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