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Stress-strain behavior of individual electrospun polymer fibers using combination AFM and SEM

  • Fei Hang (a1), Dun Lu (a2), Shuang Wu Li (a3) and Asa H Barber (a4)

Abstract

Tensile deformation of individual electrospun polyvinyl alcohol (PVA) nanofibres was performed using a novel combination atomic force microscope (AFM)- scanning electron microscope (SEM) technique. The AFM was used to provide manipulation and mechanical testing of individual PVA nanofibers while the SEM was used to observe the deformation process. Resultant stress-strain curves show how the elastic modulus shows comparable, or even slightly increased, values to isotropic films. In addition, the electrospun fibers were tested to failure to measure their tensile strength.

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Stress-strain behavior of individual electrospun polymer fibers using combination AFM and SEM

  • Fei Hang (a1), Dun Lu (a2), Shuang Wu Li (a3) and Asa H Barber (a4)

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