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STEM Analysis of the Segregation of Bi to Σ19a Grain Boundaries in Cu

Published online by Cambridge University Press:  10 February 2011

W. Sigle
Affiliation:
Max-Planck-Institut für Metallforschung und Institut für Metallkunde der Universität Stuttgart, Seestraße 92, D-70174 Stuttgart, Germany. sigle@hrem.mpi-stuttgart.mpg.de
L.-S. Chang
Affiliation:
Max-Planck-Institut für Metallforschung und Institut für Metallkunde der Universität Stuttgart, Seestraβe 92, D-70174 Stuttgart, Germany
W. Gust
Affiliation:
Max-Planck-Institut für Metallforschung und Institut für Metallkunde der Universität Stuttgart, Seestraβe 92, D-70174 Stuttgart, Germany
M. Rühle
Affiliation:
Max-Planck-Institut für Metallforschung und Institut für Metallkunde der Universität Stuttgart, Seestraβe 92, D-70174 Stuttgart, Germany
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Abstract

Cu bicrystals were doped with different amounts of Bi and annealed at various temperatures. The segregation at the grain boundary (GB) was analyzed by energy dispersive X-ray analysis (EDX) in the scanning transmission electron microscope (STEM). It is found that with both increasing temperature and increasing Bi content the amount of faceting of the GB increases, finally reaching complete faceting. This final state is distinguished by brittle behavior. By analyzing the shape of pores at the GB we found that the Cu surface energy anisotropy is probably increased by Bi surface segregation.

Type
Research Article
Copyright
Copyright © Materials Research Society 2001

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