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Standing Wave Reflectivity in Photonic Structures Using a Scattering Type Optical Near-Field Optical Microscope
Published online by Cambridge University Press: 01 February 2011
Abstract
A method for measuring locally the normalised reflectivity spectrum in waveguiding photonic structures is presented. The latter is obtained by imaging the standing wave pattern upstream of the structure with a scattering type Scanning Near-field Optical Scanning Microscope (s-SNOM) and normalised with a simple Fourier analysis. Two kinds of sample are investigated. The first one is a corrugated integrated waveguide, the second is a fiber Bragg grating. The s-SNOM technique applied to waveguiding structures is first introduced with the case of a straight waveguide.
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- Copyright © Materials Research Society 2004