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Stability of Indium Tin Oxide/Polymer Interfaces

  • X. Crispin (a1), A. Crispin (a1), M. P. de, S. Marciniak (a1), W. Osikowicz (a1), S. Jönsson (a2), M. Fahlman (a2), Th. Kugler (a3), L. J. van IJzendoorn (a4), M. J. A. de and W. R. Salaneck (a1)...

Abstract

Interfacial chemistry at indium tin oxide/polymer interfaces is of fundamental importance for the performance of polymer-based light emitting diodes. X-ray photoelectron spectroscopy and Rutherford backscattering spectrometry are used to investigate the stability of the interface formed between indium tin oxide and (i) the light emitting polymer poly(p-phenylenevinylene), and (ii) the hole injecting layer poly(3,4-ethylenedioxythiophene) polystyrenesulfonate. The formed interfaces are not stable and indium-containing species diffuse from the metal oxide surface into the polymer layers.

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Stability of Indium Tin Oxide/Polymer Interfaces

  • X. Crispin (a1), A. Crispin (a1), M. P. de, S. Marciniak (a1), W. Osikowicz (a1), S. Jönsson (a2), M. Fahlman (a2), Th. Kugler (a3), L. J. van IJzendoorn (a4), M. J. A. de and W. R. Salaneck (a1)...

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