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Solving the Structure of Interfaces by High Resolution Electron Microscopy

Published online by Cambridge University Press:  28 February 2011

Alain Bourret
Alain Bourret*
Affiliation:
Service de Physique,S. CEN-Grenoble, 85 X, 38041 Grenoble Cédex, France
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Abstract

This paper reviews some of the new advancements made in solving the structure of planar interfaces in a wide range of materials and interface types. The main contributions of the HREM technique are the determination of the atomic positions at the interface, the detection of additional defects such as dislocations or monoatomic steps and more recently the chemical composition when crossing the interface. It is concluded that quantitative results obtained by image processing and pattern recognition will in the future greatly improve the knowledge of interfacial structures at an atomic scale.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 138: Symposium Q – Characterization of the Structure and Chemistry of Defects in Materials , 1988 , 293
Copyright
Copyright © Materials Research Society 1989

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