Hostname: page-component-cd9895bd7-jn8rn Total loading time: 0 Render date: 2024-12-26T10:32:38.903Z Has data issue: false hasContentIssue false

Solvent-enhanced Dye Diffusion in Polymer This-Films for OLED Application

Published online by Cambridge University Press:  21 March 2011

F. Pschenitzka
Affiliation:
Department of Electrical Engineering, Center for Photonic and Optoelectronic Materials (POEM), Princeton University, Princeton, NJ 08544
K. Long
Affiliation:
Department of Electrical Engineering, Center for Photonic and Optoelectronic Materials (POEM), Princeton University, Princeton, NJ 08544
J. C. Sturm
Affiliation:
Department of Electrical Engineering, Center for Photonic and Optoelectronic Materials (POEM), Princeton University, Princeton, NJ 08544
Get access

Abstract

A method of solvent-enhanced dye diffusion in polymer films for organic light-emitting diode (OLED) application is introduced. After an initial dye transfer from a dye source substrate into the top of the electractive polymer film, the device substrate is then exposed to solvent vapor. Due to solvent absorption by the polymer film, the glass transition temperature of the polymer is significantly decreased, which leads to greatly enhanced diffusion of the dye in the polymer film. Secondary ion mass spectroscopy shows that the temperature for dye diffusion can be decreased by 150 °C. OLEDs with 0.4% external quantum efficiency were demonstrated. The materials used are the polymer poly(9-vinylcarbazole) (PVK) combined with electron transport molecules (PBD), and the dyes coumarin 47, coumarin 6 and Nile red.

Type
Research Article
Copyright
Copyright © Materials Research Society 2001

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Forrest, S. R., IEEE J Sel Top in Quantum Electron 6 (6), 1072 (2000).Google Scholar
2. Millard, I. S., Synth Met 111, 119 (2000).Google Scholar
3. Hebner, T. R., Wu, C. C., Marcy, D., Lu, M. H., and Sturm, J. C., Appl Phys Lett 72 (5), 519 (1998).Google Scholar
4. Kobayashi, H., Kanbe, S., Seki, S., Kigchi, H., Kimura, M., Yudasaka, I., Miyashita, S., Shimoda, T., Towns, C. R., Burroughes, J. H., and Friend, R. H., Syn Met 111, 125 (2000).Google Scholar
5. Chang, S.-C., Bhanathan, J., and Yang, Y., Appl Phys Lett 73 (18), 2561 (1998).Google Scholar
6. Pardo, D. A., Jabbour, G. E., and Peyghambarian, N., Adv Mater 12 (17), 1249 (2000).Google Scholar
7. Hebner, T. R. and Sturm, J. C., Appl Phys Lett 73 (13), 1775 (1998).Google Scholar
8. Kido, J., Shirai, S., Yamagata, Y., and Harada, G., presented at Mat Res Soc Symp,San Francisco, CA (1999).Google Scholar
9. Pschenitzka, F. and Sturm, J. C., Appl Phys Lett 74 (13), 1913 (1999).Google Scholar
10. Pschenitzka, F. and Sturm, J. C., “Patterning Technologies for polymer OLED displays,” presented at the SPIE, San Diego, CA, 2000 (unpublished).Google Scholar
11. Wu, C.-c., Yang, C.-c., Chang, H.-h., Chen, C.-W., and Lee, C.-C., Appl Phys Lett 77 (6), 794 (2000).Google Scholar
12. Tada, K. and Onoda, M., Jpn J Appl Phys 38, L1143 (1999).Google Scholar
13. Wu, C. C., Sturm, J. C., Register, R. A., Tian, J., Dana, E. P., and Thompson, M. E., IEEE Trans Electron Devices 44 (8), 1269 (1997).Google Scholar
14. Pschenitzka, F. and Sturm, J. C., Appl Phys Lett 78 (17), 2584 (2001).Google Scholar
15. Alfrey, T., Gurnee, E. F., and Lloyd, W. G., J Poly Sci C12 (12), 249 (1966).Google Scholar
16. Kwei, T. K. and Zupko, H. M., J Polym Sci A-2, Polym Phys 7 (5), 867 (1969).Google Scholar
17. Crank, J. and Park, G. S., Diffusion in polymers (Academic Press, London, New York, 1968).Google Scholar
18. Frick, T. S., Huang, W. J., Tirrell, M., and Lodge, T. P., J Polym Sci Part B 28 (13), 2629 (1990).Google Scholar
19. Krevelen, D. W. v., Properties of polymers : their correlation with chemical structure, their numerical estimation and prediction from additive group contributions, 3rded. (Elsevier, Amsterdam; New York, 1990).Google Scholar