Hostname: page-component-848d4c4894-pjpqr Total loading time: 0 Render date: 2024-06-26T20:48:41.759Z Has data issue: false hasContentIssue false
  • English
  • Français

Sol-Gel Synthesis and Characterization of Neodymium-Ion Doped Nanostructured Titania Thin Films

Published online by Cambridge University Press:  15 March 2011

Andrew Burns ,
W. Li ,
C. Baker  and
S.I. Shah
Andrew Burns
Affiliation:
Department of Material Science and Engineering, University of Delaware, Newark, DE 19716
W. Li
Affiliation:
Department of Material Science and Engineering, University of Delaware, Newark, DE 19716
C. Baker
Affiliation:
Department of Material Science and Engineering, University of Delaware, Newark, DE 19716
S.I. Shah
Affiliation:
Department of Material Science and Engineering, University of Delaware, Newark, DE 19716 Department of Physics and AstronomyUniversity of Delaware, Newark, DE 19716
Get access

Abstract

Nd doped TiO2 nanostructured thin films were prepared by sol-gel technique on quartz and Si substrates using TiCl4 precursor. As-deposited amorphous films were annealed to form anatase phase in the thin films. The film grain size increased with annealing temperature. Above 800°C, rutile began to segregate and the grain size decreased slightly.

The photodegradation of 2-chlorophenol (2-CP) was studied. Doping TiO2 with Nd+3 reduced the photodegradation time. The difference in the ionic radii of Nd+3 and Ti+4 and the oxygen affinities of Nd and Ti were responsible for this effect. These differences help promote electron trapping, thereby increasing the lifetime of the holes which are responsible for the oxidation of 2-CP.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 703: Symposia U/V – Nanophase and Nanocomposite Materials IV , 2001 , V5.2
Copyright
Copyright © Materials Research Society 2002

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Beydoun, D., Amal, R., Low, G., McEvoy, S., Journal of Nanoparticle Research 1: 439–458, Kluwer Academic Publishers, NetherlandsGoogle Scholar
2. Aruna 1996. Journal of Materials Synthesis and Processing 4 (3), 175–179.Google Scholar
3. Bach, U., Lupo, D., Comte, P., Moser, J.E., Weissortel, F., Salbeck, J., Spreitzer, H., and Gratzel, M., Nature 395, 583 (1998).Google Scholar
4. Zhang, Z., Wang, C., Zakaria, R., and Ying, J., J. Phys. Chem. B 102, 10871 (1998).Google Scholar
5. Li, W., Shah, S. Ismat, Huang, C.-P., Jung, O. and Ni, C., to be published in J. Appl. Phys.Google Scholar
6. Zhou, Y., Wang, C.Y., Liu, H.J., Zhu, Y.R., Chen, Z.Y., Materials Science and Engineering B67, 95 (1999).Google Scholar
7.Freeware form http://www.ccp14.ac.uk/tutorial/xfit-95/Google Scholar
8. Cullity, B.D., Elements of X-Ray Diffraction (Addison-Wesley, Menlo Park, CA 1978).Google Scholar
9. Edelson, L.H. and Glaeser, A.M., Amer, J., Ceram. Soc. 71, 225 (1988).Google Scholar
10. Wagner, C.D., Riggs, W.M., Davis, L.E., Moulder, J.F., and Muilenberg, G.E. (Eds), Handbook of X-ray Photoelectron Spectroscopy (Perkin-Elmer corporation, 1979).Google Scholar
11. Sen, S.K., Riga, J., and Verbist, J., Chem. Phys. Lett. 39, 560 (1976).Google Scholar
12. Shannon, R.D., Acta Crystallogr. Sect. A 32, 751 (1976).Google Scholar
13. Shannon, R.D. and Prewitt, C.T., Acta Crystallogr. Sect. B 25, 925 (1969).Google Scholar