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Soft X-Ray Photoelectron Spectroscopy Of Bi-Metallic Interfacial Bonding

  • N. D. Shinn (a1), B. Kim (a2), A. B. Andrews (a2), J. L. Erskine (a3), K. J Kim (a4) and T.-H. Kang (a4)...

Abstract

We report the first application of Soft X-ray Photoelectron Spectroscopy (SXPS) to probe the bonding at epitaxial, bi-metallic interfaces with atomic-layer spatial selectivity. Specifically, we have measured the W(4f)7/2 levels of interfacial tungsten atoms for (1×1)Fe/W(110), (1×1)Ni/W(110), and (1×1)PtW(110). For clean W(110), the surface atoms exhibit a W(4f)7/2 peak at -320 meV binding energy with respect to the bulk W(4f)7/2 peak. Upon formation of the metallic overlayers, the interfacial tungsten atoms contribute W(4f)7/2 peaks at -225 meV (Fe/W), -140 meV (Ni/W), and +70 meV (Pt/W) with respect to the bulk W(4f)7/2 peak. The systematic reduction in the binding energy difference between interfacial and bulk tungsten atoms for Fe, Ni, and Pt correlates with increasing heats of adsorption on W(110), as determined by Temperature Programmed Desorption. This suggests that SXPS, in combination with first principles calculations and Born-Haber thermochemical cycle analyses, can be used as a non-destructive probe of bi-metallic interfacial bonding energies.

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(2)

Present address: National Synchrotron Light Source, Building 725A-U3, Brookhaven National Laboratory, Upton, NY 11973-5000.

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1. Gradmann, U. and Waller, G., Surf. Sci. 116, 539 (1982).
2. Berlowitz, P. J., He, J.-W. and Goodman, D. W., Surf. Sci. 231, 315 (1990).
3. Berlowitz, P. J. and Goodman, D. W., Surf. Sci. 187, 463 (1987).
4. Shivaprasad, S. M., Demmin, R. A. and Madey, T. E., Thin Solid Films 163, 393 (1988).
5. Madey, T. E., Song, K.-J., Dong, C.-Z. and Demmin, R. A., Surf. Sci. 247, 175 (1991).
6. Shinn, N. D., Peden, C. H. F., Tsang, K. L. and Berlowitz, P. J., Physica Scripta 41, 607 (1990).
7. Kim, B., Shinn, N. D., Andrews, A. B. and Erskine, J. L., Phys. Rev. Lett. (submitted) and to be published.
8. Kim, B., Kim, K. J., Kang, T.-H., Shinn, N. D. and Erskine, J. L., in preparation.
9. Tran Minh Duc, G-uillot, C., Lassailly, Y., Lecante, J., Jugnet, Y. and Verdrine, I. C., Phys. Rev. Lett. 43, 789 (1979).
10. Doniac, S. and Sunjic, M., J. Physics C3, 285 (1970).
11. Riffe, D. M., Wertheim, G. K. and Citrin, P. H., Phys. Rev. Lett. 63, 1976 (1989).
12. Desjonqueres, M. C., Spanjaard, D., Lassailly, Y. and Guillot, C., Solid State Comm. 34, 807 (1980).
13. Riffe, D. M. and Wertheim, G. K., Phys. Rev. B 47, 6673 (1993).
14. Hong, S. C., Freeman, A. J. and Fu, C. L., Phys. Rev. B 38, 12156 (1988).

Soft X-Ray Photoelectron Spectroscopy Of Bi-Metallic Interfacial Bonding

  • N. D. Shinn (a1), B. Kim (a2), A. B. Andrews (a2), J. L. Erskine (a3), K. J Kim (a4) and T.-H. Kang (a4)...

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