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Small-Angle Scattering Methods for Studying the Sintering of Nanophase Ceramic Compacts

Published online by Cambridge University Press:  22 February 2011

Susan Krueger
Affiliation:
National Inst. of Standards and Technology, Gaithersburg, MD 20899
Andrew J. Allen
Affiliation:
National Inst. of Standards and Technology, Gaithersburg, MD 20899 University of Maryland, College Park, MD 20742
Ganesh Skandan
Affiliation:
Rutgers University, Piscataway, NJ 08855
Gabrielle G. Long
Affiliation:
National Inst. of Standards and Technology, Gaithersburg, MD 20899
Horst Hahn
Affiliation:
National Inst. of Standards and Technology, Gaithersburg, MD 20899
Helen M. Kerch
Affiliation:
National Inst. of Standards and Technology, Gaithersburg, MD 20899 U.S. Dept. of Energy, Germantown, MD 20585
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Abstract

Studies of microstructure evolution as a function of sintering parameters are necessary to better control the microstructure of nanophase ceramic compacts during processing. Small-angle scattering provides a comprehensive probe of the statistically-representative microstructures present in nanophase ceramics. A complete characterization includes complementary density, electron microscopy, nitrogen desorption and x-ray diffraction measurements. Small-angleneutron and ultra-small-angle x-ray scattering have been used to determine the effects of different sintering temperatures, pressures and additives during sintering of nanophase zirconia compacts. The samples were of sufficient size and uniformity to permit absolute calibration of the scattering data, making it possible to confirm that scattering from the pore/grain interface dominates the total scattering cross-section. A quantitative microstructural model was developed for this system, resulting in the determination of specific pore surface area, total pore volume fraction, pore number size distribution and grain size as a function of sintering parameters.

Type
Research Article
Copyright
Copyright © Materials Research Society 1995

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References

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