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Single-Carrier Devices for the Understanding of the Voltage Drift in Organic Light Emitting Diodes

Published online by Cambridge University Press:  22 June 2011

J. Boizot ,
V. Gohri  and
H. Doyeux
J. Boizot
Affiliation:
Laboratory of Technology and Components for the Visualization, Optronic Department, CEA-LETI Grenoble, 17 rue des Martyrs, 38054 Grenoble Cedex 9, France
V. Gohri
Affiliation:
Laboratory of Technology and Components for the Visualization, Optronic Department, CEA-LETI Grenoble, 17 rue des Martyrs, 38054 Grenoble Cedex 9, France
H. Doyeux
Affiliation:
Laboratory of Technology and Components for the Visualization, Optronic Department, CEA-LETI Grenoble, 17 rue des Martyrs, 38054 Grenoble Cedex 9, France
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Abstract

The aim of this study is to analyze and mitigate the voltage drift phenomenon observed in top-emitting organic light emitting diodes (OLED) when driven at constant current. An operating device may experience voltage increase over time due to factors such as interface or bulk material degradation, charge accumulation and formation of trap states. Single-carrier devices were fabricated to understand the contribution to voltage drift from each of these causes. Doping in electron injection layer (4, 7-diphenyl-1,10-phenanthroline or Bphen) and hole injection layer (2,2’,7,7’-tetra(N,N-di-tolyl)amino-spiro-bifluorene or Spiro-TTB) were optimized to obtain ohmic injection contacts. Devices with tris(8-hydroxy-quinoline) aluminium (Alq3) degrade significantly with holes injection and undergo high voltage increase in lifetime test measurements. On the contrary, devices with N,N’-di(naphtalen-1-y1)-N,N’-diphenyl-benzidine (NPB) exhibit an ambipolar charge transport behavior and low voltage drift under both hole and electron injection.

Keywords

organicelectrical propertiesdopant
Type
Articles
Information
MRS Online Proceedings Library (OPL) , Volume 1359: Symposium NN – Electronic Organic and Inorganic Hybrid Nanomaterials—Synthesis, Device Physics and Their Applications , 2011 , mrss11-1359-nn03-02
Copyright
Copyright © Materials Research Society 2011

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References

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