Hostname: page-component-7479d7b7d-c9gpj Total loading time: 0 Render date: 2024-07-11T15:04:04.588Z Has data issue: false hasContentIssue false

Shape of piezoelectric hysteresis loop for non-ferroelastic switching

Published online by Cambridge University Press:  01 February 2011

A. K. Tagantsev
Affiliation:
Ceramics Laboratory, Swiss Federal Institute of Technology, EPFL, 1015 Lausanne, Switzerland
P. Muralt
Affiliation:
Ceramics Laboratory, Swiss Federal Institute of Technology, EPFL, 1015 Lausanne, Switzerland
J. Fousek
Affiliation:
Department of Electrical Engineering and Electromechanical Systems, Technical University of Liberec, CZ-46117 Liberec, Czech Republic
Get access

Abstract

A simple theory for the shape of the piezoelectric hysteresis loops (piezoelectric coefficient d vs. applied electric field E) is developed for the case of non-ferroelelastic 180° switching in ferroelectrics. The theory provides explanations for specific features of piezoelectric hysteresis loops, which have been observed in single crystals, thin films and in ceramics in particular. The piezoelectric coefficient may show a “hump”, i.e. when E decreases from the tip of the loop down to zero, d passes through a maximum, and a “nose”, i.e. a self-crossing of the loop close to its tips. The theory also explains the difference in the coercive fields seen in the polarization and piezoelectric loops.

Type
Research Article
Copyright
Copyright © Materials Research Society 2004

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Hiboux, S., Muralt, P., and Maeder, T., Journal of Materials Research, 14, 4307, (1999).Google Scholar
2. Schmidt, G., Borchardt, G., Cieminski, J. V., Grützmann, D., Purinsch, E., and Isupov, V. A., Ferroelectrics, 42, 3, (1982).Google Scholar
3. Cieminski, J. V. and Schmidt, G., Ferroelectrics, 81, 233, (1988).Google Scholar
4. Chen, L., Nagarajan, V., Ramesh, R., and Roytburd, A. L., Journal of Applied Physics, 94, 5147, (2003).Google Scholar
5. Uchida, N. and Ikeda, T., Jpn. J. Appl. Phys., 4, 867, (1965).Google Scholar
6. Cieminski, J. V., Kleint, J. C., Beige, H., and Höche, R., Ferroelectrics, 109, 95, (1990).Google Scholar
7. Tagantsev, A. K., Muralt, P., and Fousek, J., (to be published).Google Scholar