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Seeding Solid Phase Crystallization of Amorphous Silicon Films with Embedded Nanocrystals

Published online by Cambridge University Press:  01 February 2011

Curtis Anderson
Affiliation:
curtis@me.umn.edu, University of Minnesota, Department of Mechanical Engineering, 111 Church St. S.E., Minneapolis, MN, 55455United States
Uwe Kortshagen
Affiliation:
uk@me.umn.edu, University of Minnesota, Department of Mechanical Engineering, 111 Church St. S.E., Minneapolis, MN, 55455, United States
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Abstract

Silicon nanocrystals with diameters up to 30 nm are used as nucleation seeds for fast solid phase crystallization of amorphous silicon films. Purely amorphous films required an incubation time of up to 12 hours at 600°C prior to the onset of nucleation, while films with nanocrystals embedded between layers of amorphous silicon grew immediately upon annealing in a quartz tube furnace. Structural characterization was performed by heated-stage transmission electron microscopy and Raman spectroscopy.

Type
Research Article
Copyright
Copyright © Materials Research Society 2008

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References

REFERENCES

2. Green, M.A. Emery, K. Hisikawa, Y. Warta, W. Prog. Photovolt: Res. Appl., 15 (2007) 425430 Google Scholar
3. Campbell, S. A. (2001). The Science and Engineering of Microelectronics Fabrication. New York, Oxford University Press.Google Scholar
4. Jiang, Y.L. Chang, Y.C. Thin Solid Films, 500 (2006) 316321 Google Scholar
5. Mahan, A. H., Roy, B. Jr. Reedy, R. C. Readey, D. W., Ginley, D. S., J. Appl. Phys., 99 (2006) 023507.Google Scholar
6. Iverson, R. B., Reif, R. J. Appl. Phys., 62 (1987) 16751681 Google Scholar
7. Kuo, C.C. Yeh, W.C. Lee, J.F. Jeng, J.W. Thin Solid Films, 515 (2007) 80948100 Google Scholar
8. Ishikawa, Y. Nakamura, A. Uraoka, U. Fuyuki, T. Jpn. J. Appl. Phys., 43 (2004) 877881 Google Scholar
9. Lee, S.R. Ahn, K.M. Ahn, B.T. J. Electrochem. Soc., 154 (2007) H778–H781.Google Scholar
10. Bapat, A. Anderson, C. Perrey, C.R. Carter, C.B. Campbell, S.A. Kortshagen, U. Plasma Phys. Control. Fusion, 46 (2004) B97–B109.Google Scholar