Skip to main content Accessibility help
×
Home

Scanning Tunneling Microscopy and Spectroscopy of Y-Ba-Cu-O Thin Films Produced by Ion Beam Sputter-Deposition

  • R. C. Chapman (a1), O. Aucffillo (a1) (a2), D. J. LichtenWalner (a2), R. P. Adu (a1), C. N. SobleII (a2), K. N. Christensen (a2), R. R. Woolcott (a2), L. M. Chen (a3), T. R. Barr (a3) and A. I. Kingon (a2)...

Abstract

Ion beam sputter-deposition has been used to produce high temperature superconducting (HTSC) thin films with controlled orientation. Room temperature scanning tunneling microscopy (STM) studies of ion beam sputter-deposited Y-Ba-Cu-O thin films indicate that the growth mode depends on whether the films are a- or c-axis oriented. The c-axis oriented films appear to grow by a screw dislocation mechanism, producing layered spirals similar to those observed in films grown by plasma sputtering and laser ablation-deposition. STM images of the a-axis oriented films show a growth mode which appears to produce layered structures perpendicular to the substrate with no spirals. Scanning tunneling spectroscopy (STS) studies of the a- and c-axis oriented films tend to reflect the anisotropy of the Y-Ba-Cu-O structure. Both the c-axis and the a-axis oriented films have semiconducting characteristics, possibly due to a native oxide, with a band gap estimated to be 1.4 eV. The c-axis oriented film, however, exhibits more fine structure in its density of states. This apparent anisotropie band structure reflects the anisotropie Y-Ba-Cu-O microstructure and superconducting characteristics. Investigations with x-ray photcelectron spectroscopy (XPS) establish a substantial chemical difference between the two surfaces inferring more substantial native oxides and air-induced by-products on the a-axis oriented film.

Copyright

References

Hide All
[1[ Lyons, W. G., Bonetti, R. R., Williams, A. E., Mankiewich, P. M., O'Malley, M. L., Hamm, J. M., Anderson, A. C., Withers, R. S., Meulenberg, A., and Howard, R. E., IEEE Trans. Magn. MAG- 27, 2537 (1991).
[2] Ono, R. H., Beal, J. A., Cromar, M. W., Harvey, T. E., Johansson, M. E., Reintsema, C. D., and Rudman, D. A., Appl. Phys. Lett. 59, 1126 (1991).
[3] Stratton, T. G., Cole, B. E., Kruse, P. W., Wood, R. A., Beauchamp, K., Wang, T. F., Johnson, B., Goldman, A. M., Appl. Phys. Lett. 57, 99 (1990).
[4] Singh, R., Rev. Solid State Sci. 2, 473 (1988).
[5] Pavuna, D., Dwir, B., Gauzzi, A., James, J. H., Kellet, B. J., SPIE, 1362, 102 (1990).
[6] Hansma, P. K., Tersoff, J., J. Appl. Phys., 61(2), 15 Jan 1987.
[7] Demuth, J. E., Hamers, R. J., Tromp, R. M., American Institute of Physics, 496 (1987).
[8] Chapman, R., Kellam, M., Goodwin-Johansson, S., Russ, J., McGuire, G. E., Kjoller, K., J. Vac. Sci. Technol. B10(1), 502 (1992).
[9] Massidda, S., Yu, Jaejun, Freeman, A. J., Koelling, D. D., Physics Letters A, 122 (3), 198 (1987).
[10] Yu, Jaejun, Massidda, S., Freeman, A. J., Koelling, D. D., Physics Letters A 122 (3), 203 (1987).
[11] Ching, W. Y., Xu, Y., Zhao, G. -L., Wong, K. W., Zandiehnadem, F., Physical Review Utters 59 (12), 1333 (1987).
[12] Cava, R. J. et al., Phys. Rev. Lett. 58, 1676 (1987).
[13] Hawley, M., Raistrick, I. D., Beery, J. G., Holton, R. J., Science 251, 1587 (1991).
[14] Ktebs, H. U., Krauns, Ch., Yang, X., Geyer, U., Appl. Phys. Lett, 59, 2180 (1991).
[15] Lichtenwalner, D. J., Auciello, O., Woolcott, R. R. Jr, Soble, C. N. II, Adu-Poku, R., Chapman, R., Rou, S. H., Duarte, J., Kingon, A. I., to be published in the J. Vac. Sci. Technol. A10, July/Aug. (1992).
[16] Parks, D. C., Wang, J., Clark, N. A., Hermann, A. M., Appl. Phys. 59 (12), 1506 (1991).
[17] Wu, X. L., Lieber, C. M., Ginley, D. S., Baughman, R. J., Appl. Phys. Len. 55 (10), 2129 (1989).
[18] Hasegawa, T., Kitazawa, K., Bull. Mater. Sci. 14 (3), 719 (1991).
[19] Shih, C. K., Feenstra, R. M., Chandrashekhar, G. V., Phys. Rev. B 43 (10), 7913 (1991).
[20] Shih, C. K., Feenstra, R. M., Kirtley, J. R., Chandrashekhar, G. V., Phys. Rev. B 43 (4), 2682 (1989).
[21] Wang, C., Giambattista, B., Slough, C. G., Coleman, R. V., Subramanian, M. A., Physical Review B 42(14), 8890 (1990).
[22] Tanaka, M., Yamazaki, S., Fujnami, M., Takahashi, T., Katayama-Yoshida, H., Mizutani, W., Kajimura, K., Ono, M., J. Vac. Sci. Technol. A8 (1), 475 (1990).
[23] Eom, C. B., Marshall, A. F., Laderman, S. S., Jacowitz, R. D., Gebelle, T. H., Scienc 249, 1549 (1990).
[24] Vassenden, F., Linker, G., Geerk, J., Physica C 175, 566(1991).

Metrics

Full text views

Total number of HTML views: 0
Total number of PDF views: 0 *
Loading metrics...

Abstract views

Total abstract views: 0 *
Loading metrics...

* Views captured on Cambridge Core between <date>. This data will be updated every 24 hours.

Usage data cannot currently be displayed