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Scaling Challenges for NAND and Replacement Memory Technology

  • Kirk Prall (a1)

Abstract

Planar NAND technology is rapidly approaching its fundamental limits and will likely transition to a three dimensional structure. The scaling challenges facing NAND will be reviewed. Emerging memory technologies, such as the cross-point, will be discussed. The materials challenges facing emerging memories will be reviewed.

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Keywords

Scaling Challenges for NAND and Replacement Memory Technology

  • Kirk Prall (a1)

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