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Sample Preparation Technique for Examination of SiC Whisker Cross-Sections

Published online by Cambridge University Press:  21 February 2011

S. A. Bradley ,
N. L. Dietz  and
K. R. Karakek
S. A. Bradley
Affiliation:
Allied-Signal Engineered Materials Research Center, 50 E. Algonquin Road, Des Plaines, IL 60017
N. L. Dietz
Affiliation:
Allied-Signal Engineered Materials Research Center, 50 E. Algonquin Road, Des Plaines, IL 60017
K. R. Karakek
Affiliation:
Allied-Signal Engineered Materials Research Center, 50 E. Algonquin Road, Des Plaines, IL 60017
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Abstract

An ultramicrotomy technique for preparing SiC whisker cross-sections is described. With this method a large number of axially oriented whiskers can be examined.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 115: Symposium W – Specimen Preparation for Transmission Electron Microscopy of Materials I , 1987 , 115
Copyright
Copyright © Materials Research Society 1988

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References

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