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Sample Preparation Technique for Examination of SiC Whisker Cross-Sections

  • S. A. Bradley (a1), N. L. Dietz (a1) and K. R. Karakek (a1)

Abstract

An ultramicrotomy technique for preparing SiC whisker cross-sections is described. With this method a large number of axially oriented whiskers can be examined.

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References

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1. van Torne, L.I., J. Appl. Phys. 37, 1849 (1966).
2. Nutt, S.R., J. Amer. Ceram. 67, 428 (1984).
3. Comer, J.J., Mater. Res. Bull. 4, 279 (1969).
4. Iwanaga, H., Yoshiie, T., Katuki, H., Egashira, M. and Takeuchi, S., J. Mater. Sci. Lett 5, 946 (1986).

Sample Preparation Technique for Examination of SiC Whisker Cross-Sections

  • S. A. Bradley (a1), N. L. Dietz (a1) and K. R. Karakek (a1)

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