Hostname: page-component-7c8c6479df-hgkh8 Total loading time: 0 Render date: 2024-03-29T05:54:05.425Z Has data issue: false hasContentIssue false

Resonant X-Ray Fluorescence Spectroscopy at The V L-Edges of Vanadium Oxides

Published online by Cambridge University Press:  10 February 2011

L.-C. Duda
Affiliation:
Department of Physics, Boston University, Boston, MA 02215
C. B. Stagarescu
Affiliation:
Department of Physics, Boston University, Boston, MA 02215
J. E. Downes
Affiliation:
Department of Physics, Boston University, Boston, MA 02215
K. E. Smith
Affiliation:
Department of Physics, Boston University, Boston, MA 02215
G. Dräger
Affiliation:
Fachbereich Physik der Martin-Luther-Universität Halle-Wittenberg, D-06108 Halle, Germany
Get access

Abstract

We have studied resonant V Lα-fluorescence spectra of vanadium oxides with V in several different oxidation states. The spectra are dominated by the O 2p-contribution centered at about 6 eV below the top of the valence band (VB-top). The V 3d-contribution, found close to the VB-top, increases with decreasing valency of the vanadium atoms. Resonant inelastic (Raman) x-ray scattering is fairly weak in these compounds and overlaps with the ordinary fluorescence spectrum. Large spectral changes of V Lα-fluorescence in the metal-insulator transition of V2O3 have been observed.

Type
Research Article
Copyright
Copyright © Materials Research Society 1998

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Shin, S., Suga, S., Taniguchi, M., Fujisawa, M., Kanzaki, H., Fujimori, A., Daiman, H., Ueda, Y., Kosuge, K., and Kachi, S., Phys. Rev. B41, 4993 (1990), and references thereinGoogle Scholar
2. Smith, K.E. and Henrich, V.E., Phys. Rev. B50, 1382 (1994)Google Scholar
3. Abbate, M., de Groot, F.M.F., Fuggle, J.C., Ma, Y.J., Chen, C.T., Sette, F., Fujimori, A., Ueda, Y., Kosuge, K., Phys. Rev. B43, 7263 (1991)Google Scholar
4. Werfel, F., Dräger, G., and Berg, U., Crystal Research and Technology 16, 119 (1981)Google Scholar
5. Friedman, S.P., Cherkashenko, V.M., Gubanov, V.A., Kurmaev, E.Z., and Volkov, V.L., Z. Phys. B46, 31 (1982)Google Scholar
6. Shin, S., Agui, A., Watanabe, M., Fujisawa, M., Tezuka, Y., and Ishii, T. Kanzaki, H., J. Electron Spectros. 79, 125 (1996)Google Scholar
7. Duda, L.-C., PhD Thesis, Uppsala (1996);Google Scholar
Kurmaev, E.Z., Cherkashenko, V.M., Yarmashenko, Yu.M., Bartkowski, St., Postnikov, A.V., Neumann, M., Duda, L.-C., Guo, J.-H., Nordgren, J., and Perelyaev, V.A., to appear in J. Phys.: Cond. Matter (1998)Google Scholar
8.. Gupta, M., Freeman, A.J., and Ellis, D.E., Phys. Rev. B16, 3338 (1977);Google Scholar
Gervais, F. and Kress, W., Phys. Rev. B31, 4809 (1985)Google Scholar
Wentzkovitch, R.M., Schulz, W.W., and Allen, P.B., Phys. Rev. B72, 3389 (1994)Google Scholar
9. Butorin, S. M., Guo, J.-H., Magnuson, M., Kuiper, P., and Nordgren, J., Phys. Rev. B54, 4405 (1996);Google Scholar
Butorin, S. M., Guo, J.-H., Magnuson, M., and Nordgren, J., Phys. Rev. B55, 4242 (1997)Google Scholar
10. Nordgren, J., Bray, G., Cramm, S., Nyholm, R., Rubensson, J.-E., and Wassdahl, D., Rev. Sci. Instrum. 66, 1690, (1989)Google Scholar