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Reflectivity of Soft X-Rays by Polymer Mixtures

Published online by Cambridge University Press:  21 February 2011

T. P. Russell ,
W. Jark ,
G. Comelli  and
J. Stöhr
T. P. Russell
Affiliation:
IBM Research Division Almaden Research Center 650 Harry Road San Jose, California 95120-6099
J. Stöhr
Affiliation:
IBM Research Division Almaden Research Center 650 Harry Road San Jose, California 95120-6099
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Abstract

The specular reflectivty of soft x-rays has been used to investigate the surface behavior of mixtures of poly(vinylidene fluoride), PVF2, and poly(methyl methacrylate), PMMA. Mixtures where the concentration of PMMA is 0.8 where investigated as a function of the preparation and annealing conditions. It was found that mixtures prepared by rapidly casting from dimethylformamide, DMF, exhibited a gradient in the concentration of the two components. The gradient extended over large distances and was such that PMMA, the higher surface energy component was located preferentially at the surface. With annealing at 165°C, the width of the gradient diminished but the concentration of PMMA remained high at the surface. Films of the mixtures prepared under a slower solvent evaporation procedure produced a reflectivity profile characteristic of a phase separated mixture. The extent of phase separation was reduced with annealing. In all cases the roughness of the surface of the films was found to be 5.OÅ or less.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 143: Symposium V – Synchrotron Radiation in Materials Research , 1988 , 265
Copyright
Copyright © Materials Research Society 1989

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