Hostname: page-component-7bb8b95d7b-l4ctd Total loading time: 0 Render date: 2024-09-25T23:01:27.083Z Has data issue: false hasContentIssue false
  • English
  • Français

Reflection Electron Microscopy and Diffraction from Crystal Surfaces

Published online by Cambridge University Press:  21 February 2011

J.M. Cowley
J.M. Cowley*
Affiliation:
Department of Physics, Arizona State University Tempe, Arizona 85287, USA
Get access

Abstract

The recent revival of techniques for the imaging of crystal surfaces, using electrons forward-scattered in the RHEED mode and employing modern electron microscopes, has lead to the introduction of valuable new methods for the study of surface structure. Either fixed beam or scanning transmission electron microscopy (STEM) instruments may be used and in each case a lateral resolution of 10Å or better is possible. Simple theoretical treatments suggest that the contrast from surface steps may be attributed to a combination of phase-contrast, diffraction contrast and geometric effects. With a STEM instrument the image information can be combined with information on the local composition and crystal structure by use of microanalysis and microdiffraction techniques. Examples of applications include studies of the surface structure of metals, semiconductors and oxides, and the surface reactions.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 31: Symposium N – Electron Microscopy of Materials , 1983 , 177
Copyright
Copyright © Materials Research Society 2006

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Højlund Nielsen, P.E. and Cowley, J.M., Surface Science 54, 340–354 (1976).Google Scholar
2. Osakabe, N., Tanishiro, Y., Yagi, K. and Honjo, G., Surface Science 97, 393–408 (1980).Google Scholar
3. Wells, O.C., Appl. Phys. Letters 19, 232–235 (1971).Google Scholar
4. Colella, R. and Menadue, J.F., Acta Crystallogr. A28, 16–22 (1972).Google Scholar
5. Ino, S., Japan. J. Appl. Phys. 19, 1277–1290 (1980).CrossRefGoogle Scholar
6. Colella, R., Acta Crystallogr. A28, 11–16 (1972).Google Scholar
7. Moon, A.R., Z.f. Naturforsch. 27a, 390–395 (1972).Google Scholar
8. Maksym, P.A. and Beeby, J.L., Surface Science 110, 423–438 (1981).Google Scholar
9. Shuman, H., Ultramicroscopy 2, 361–369 (1977).Google Scholar
10. Hsu, T., Iijima, Sumio and Cowley, J.M., Surface Science. In press.Google Scholar
11. Hsu, T. and Cowley, J.M., Ultramicroscopy. In press.Google Scholar
12. Osakabe, N., Tanishiro, Y., Yagi, K. and Honjo, G.. Surface Science 102, 424–442 (1981).Google Scholar
13. Hsu, T., Ultramicroscopy 11, 167–172 (1983).Google Scholar
14. Yagi, K., in Scanning Electron Microscopy/1982 Part IV, Johari, Om, Ed., (SEM Inc., Chicago 1982) pp. 1421–1428.Google Scholar
15. Yagi, K., Takanayagi, K. and Honjo, G. in Crystals, Properties and Applications 7, Freyhardt, H.C., Ed., (Springer Verlag, Berlin, 1980) pp. 48–74.Google Scholar
16. Cowley, J.M., Appl. Phy. Letters 15, 58–59 (1969).Google Scholar
17. Wells, O.C. in Scanning Electron Microscopy/1972 (Part I) Johari, Om and Corvin, Irene, Eds. (IIT Research Institute, Chicago, 1972) pp. 169–176.Google Scholar
18. Smith, D.A. and Treacy, M.M.J., Applic. of Surface Sci. 11/12, 131–142 (1982).Google Scholar
19. Krivanek, O.L., Tanishiro, Y., Takanayagi, K. and Yagi, K., Ultramicroscopy 11, 215–222 (1983).Google Scholar
20. Schilling, J., Z.f. Physik B25, 61–67 (1976).Google Scholar
21. Cowley, J.M., in Scanning Electron Microscopy/1982 Vol 1, Johari, Om, Ed., (SEM Inc., Chicago, 1982) pp. 51–60.Google Scholar
22. Cowley, J.M. and Spence, J.C.H., Ultramicroscopy 6, 359–366 (1981).Google Scholar
23. Turner, P.S. and Cowley, J.M., Ultramicroscopy 6, 125–138 (1981).Google Scholar
24. Iijima, S. and Hsu, T. in Electron Microscopy 1982, Vol 2, The Congress Organizing Committee, Eds. (Gesellschaft, Deutsche Elektronenmikroskopie, f. Frankfurt, e.V., 1982) pp. 293–294.Google Scholar
25. Venables, J.A., Speller, G.D.T., Fathers, D.J., Harlund, C.J. and Hanbuchen, M., Ultramicroscopy 11, 149–155 (1983).Google Scholar
26. Ichinokawa, T. in Proceedings of Ninth International Conference on Solid Surfaces, Madrid, October 1983.Google Scholar
27. Cowley, J.M. and Kang, Z.-C., Ultramicroscopy 11, 131–140 (1983).Google Scholar