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Recording IR spectra for individual electrospun fibers using an in situ AFM-synchrotron technique

  • Urszula Stachewicz (a1), Fei Hang (a2), Russell J. Bailey (a2), Himadri S. Gupta (a2), Mark D. Frogley (a3), Gianfelice Cinque (a3) and Asa H. Barber (a1) (a2)...


A setup is described where an individual electrospun polyamide fiber is attached to an atomic force microscope (AFM) tip and structural information collected with synchrotron micro Fourier transform infrared spectroscopy (μFT-IR). The combination of AFM and synchrotron μFT-IR therefore highlights the potential for recording structure-mechanical property relationships simultaneously in materials with sub-micron dimensions.



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[2] Hang, F., Lu, D., Li, S. W., Barber, A. H., Stress-strain behavior of individual electrospun polymer fibers using combination AFM and SEM, in: M. R. S. S. Proceedings, Probing Mechanics at Nanoscale Dimensions, 1185, 2009, pp. 8791.
[3] Hang, F., Lu, D., Bailey, R. J., Jimenez-Palomar, I., Stachewicz, U., Cortes-Ballesteros, B., Davies, M., Zech, M., Boedefeld, C., Barber, A. H., Nanotechnology 22 (2011).
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[7] Stachewicz, U., Barber, A. H., Langmuir 27 (2011) 30243029.



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