Skip to main content Accessibility help
×
Home

Real Time Observation of Material Deformation Processes by Synchrotron White Beam X-ray Topography

  • Z. B. Zhao (a1), J. Hershberger (a1), Z. U. Rek (a2) and J. C. Bilello (a1)

Abstract

An experimental apparatus which exploits synchrotron white beam X-ray diffraction topography has been developed to perform real time in situ observation of deformation processes of single crystals. The apparatus consists of a fully automated and remotely controlled mini-tensile device and a CCD based X-ray imaging detector with associated video system. Both tensile data and X-ray topographic images are recorded simultaneously. The materials under study include single crystals of Si, and single crystals or bicrystals of the refractory metals W and Mo. The deformation processes of these crystals have been studied by monitoring a selected transmission Laue spot while the specimen is mechanically cycled by loading and unloading. The X-ray images have been captured by a frame grabber and recorded via a VCR. Several phenomena have been observed, including bending contours, strain concentrations, reversible anelastic effect and microyielding. The observed stress relaxations are correlated to microstructural variations shown by X-ray topography. The stability of low angle grain boundaries in bicrystals; and the effect of high strength and toughness coatings on the deformation of single crystal substrates was investigated.

Copyright

References

Hide All
1. Bilello, J. C., Yalisove, S. M. and Rek, Z. U., J. Phys., D: Appl. Phys., 28, A295 (1995).
2. Bilello, J. C., Schmitz, H. A. and Dew-Hughes, D., J. Appl. Phys., 65, 2282 (1989).
3. Dudley, M., Mat. Res. Soc. Symp., 307, 213 (1993).
4. Tanner, D. K., X-ray Diffraction Topography, (Pergamon, Oxford, 1976).
5. Bilello, J. C., Mat. Res. Soc. Symp. Proc., 82, 197 (1987).
6. Ishikawa, T., J. D: Appl. Phys., 28, A256 (1995).
7. Lengeler, B., Mikrochim. Acta [Wien], 1, 455 (1987)
8. Zontone, F., Baruchel, J. and Hartwig, J., J. de Physique, Colloque C9, 4, C9423 (1994).
9. Gastaldi, J., Jourdan, C. and Grange, G., Philosophical Mag., A, 57, 971 (1988).
10. Gastaldi, J., Jourdan, C., Grange, G. and Bauer, C. L., Phys. Stat. Sol., (a), 109, 403 (1988).
11. Schmitz, H. A., Bilello, J. C. and Rek, Z. U., Materials Science and Engr., 81, 283 (1986)
12. Grange, G., Jourdan, C., Gastaldi, J. and Billia, B., J. Phys., III France 4, 293 (1994).
13. Jourdan, C., Gastaldi, J., Grange, G. and Guenin, G., J. de Physique, IV, 5, C8859 (1995).
14. Wasserbach, W., Phys. Stat. Sol., (a) 151, 61 (1995).
15. Polcarova, M. and Bradler, J., J. Appl. Cryst., 21, 169 (1988).
16. Imura, T., Materials Transactions, JIM, 32, 793 (1991).

Related content

Powered by UNSILO

Real Time Observation of Material Deformation Processes by Synchrotron White Beam X-ray Topography

  • Z. B. Zhao (a1), J. Hershberger (a1), Z. U. Rek (a2) and J. C. Bilello (a1)

Metrics

Full text views

Total number of HTML views: 0
Total number of PDF views: 0 *
Loading metrics...

Abstract views

Total abstract views: 0 *
Loading metrics...

* Views captured on Cambridge Core between <date>. This data will be updated every 24 hours.

Usage data cannot currently be displayed.