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Raman Scattering and Photoluminescence Measurements on II-VI Semiconductor Nanocrystals as a Function of Pressure and Particle Size

Published online by Cambridge University Press:  15 February 2011

John Schroeder ,
Mierie Lee ,
Markus R. Silvestri ,
Lih-Wen Hwang  and
Peter D. Persans
John Schroeder
Affiliation:
Department of Physics, Applied Physics, and Astronomy, Rensselaer Polytechnic Institute, Troy, NY 12180–3590
Mierie Lee
Affiliation:
Department of Physics, Applied Physics, and Astronomy, Rensselaer Polytechnic Institute, Troy, NY 12180–3590
Markus R. Silvestri
Affiliation:
Department of Physics, Applied Physics, and Astronomy, Rensselaer Polytechnic Institute, Troy, NY 12180–3590
Lih-Wen Hwang
Affiliation:
Department of Physics, Applied Physics, and Astronomy, Rensselaer Polytechnic Institute, Troy, NY 12180–3590
Peter D. Persans
Affiliation:
Department of Physics, Applied Physics, and Astronomy, Rensselaer Polytechnic Institute, Troy, NY 12180–3590
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Abstract

Pressure tuned photoluminescence and Raman scattering were employed to study the structural phase transition from wurtzite to rocksalt structure of CdSxSei1-x nanocrystals embedded in a glass matrix as a composite material and in the colloidal form. In both the composite and the colloidal form the increased phase stability of the wurtzite to rocksalt structure is reversible and size dependent. In contrast the phase transition in bulk semiconductors of cadmium-sulfide is sharp but for the nanocrystals it is broad and occurs at higher pressures. A size dependent study of the phase stability was conducted and a correlation between size and increase in phase stability was definitely established. For the nanocrystals in the composite form the difference in surface tension in both phases allowed for a model that predicted the tendencies observed in optical spectra. For the colloidal nanocrystals a model based on surface tension and volume effects (defects) gave good agreement in explaining the observations. The above results are discussed with respect to surface tension and deep level defects and their pressure dependence.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 452 , 1996 , 329
Copyright
Copyright © Materials Research Society 1997

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References

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