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P-Type Conversion of Nitrogen Doped ZnSe Films Grown By Mocvd

Published online by Cambridge University Press:  16 February 2011

Babar A. Khan
Affiliation:
Philips Laboratories, Briarcliff Manor, NY
Nikhil Taskar
Affiliation:
Philips Laboratories, Briarcliff Manor, NY
Donald Dorman
Affiliation:
Philips Laboratories, Briarcliff Manor, NY
Khalid Shahzad
Affiliation:
Philips Laboratories, Briarcliff Manor, NY
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Abstract

We have obtained p-type zinc selenide films by nitrogen doping combined with a post growth anneal. These films were grown on <100> gallium arsenide substrates using a low-pressure MOCVD process. Ammonia gas was used as the source for nitrogen. The as-grown films were annealed and then studied by photoluminescence (PL) and capacitance-voltage (CV) techniques. The PL data is dominated by the acceptor-bound exciton peak and donor-acceptor pair spectrum associated with the nitrogen acceptor. The C-V data shows that the films are p-type, with the highest measured net acceptor concentration of 3×1016/cm3.

Type
Research Article
Copyright
Copyright © Materials Research Society 1991

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References

REFERENCES

1. Cheng, H., DePuydt, J.M.,. Potts, I.E. and Smith, T.L., Appl. Phys. Lett. 52, 147 (1988).Google Scholar
2. Park, R.M., Troffer, M.B., Rouleau, C.M., DePuydt, J.M. and Haase, M.A., Appl. Phys. Lett. 57, 2127 (1900).Google Scholar
3. Taike, A., Migita, M. and Yamamoto, Y., Appl. Phys. Lett. 56, 1989 Google Scholar
4. Ohki, A., Shibata, N. and Zembutsu, S.,. Jap. J. Appl. Phys., Vol.27, #5, May 1988, L909L912.Google Scholar
5. Fujita, S., Tanabe, A., Sakamoto, T., Iscmura, M. and Fujita, S.,. Jap. J. Appl. Phys. 66, 1753 (1989).Google Scholar
6. Yoshikawa, A., Okamoto, T., Fujimoto, T., Onoue, K., Yamaga, S. and Kasai, K., Jap. J. Appl. Phys. 29, L225 (1990).Google Scholar
7. Marshall, T. and Cammack, D.A., J. Appl. Phys., April 1991.Google Scholar
8. Marshall, T., Colak, S. and Cammack, D.,. J. Appl. Phys. 66, 1753 (1989).Google Scholar
9. Skromme, B.J., Stoffel, N.G., Gozdz, A.S., Tamargo, M.C. and Shibli, S.M., Mat. Res. Soc. Proc. Vol.144, 391, 1989.CrossRefGoogle Scholar