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Property and Processing Comparison of Optical Coatings Made by Ion Assisted Evaporation and Magnetron Sputtering

Published online by Cambridge University Press:  10 February 2011

W. T. Pawlewicz*
Affiliation:
Barr Associates, Inc., 2 Lyberty Way, Westford, MA 01886
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Abstract

Ion Assisted Evaporation and Magnetron Sputtering are the two most important Physical Vapor Deposition processes used for optical coatings today. Each has advantages and limitations, and each is best for different coating applications. This paper provides a brief but comprehensive comparison of the two. Starting with introductory process descriptions, the paper compares Ion Assist and Sputtering feature-by-feature and ranks them in scorecard fashion. Features examined include: adatom energetics, reactivity, materials compatibility, thickness uniformity, deposition rate, substrate temperature, durability, environmental stability, refractive indices, absorption, scatter, mechanical stress control, and scalability (chamber and substrate size). The comparison is illustrated with examples from the author's twenty-four years of optical coating experience at three companies, with more than forty coating chambers (small, medium and very large), in research, development and production coating environments.

Type
Research Article
Copyright
Copyright © Materials Research Society 1999

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References

1. Handbook of Thin Film Technology, edited by Maissel, L. and Glang, R. (McGraw-Hill, New York, 1970).Google Scholar
2. Smith, D. L., Thin Films: Deposition & Applications (McGraw-Hill, New York, 1995).Google Scholar
3. Ohring, M., Materials Science of Thin Films (Academic Press, San Diego, 1992).Google Scholar
4. Pulker, H. K., Coatings on Glass (Elsevier, New York, 1984 and 1985).Google Scholar
5. Targove, J. D. and Macleod, H. A., Applied Optics 27(18) 1988, pp. 33793781.Google Scholar
6. Cuomo, J. J. and Rossnagel, S. M., Nuclear Instruments and Methods in Physics Research B19/20, 1987, pp. 963973.Google Scholar
7. Pawlewicz, W. T., Martin, P. M., Knoll, R. W., and Mann, I. B. in Deposition of Optical Coatings, edited by Jacobson, M. R. and Macleod, H. A. (SPIE, Bellingham, 1989).Google Scholar
8. Pawlewicz, W. T., Martin, P. M., Knoll, R. W., and Mann, I. B. in SPIE Proceedings 678, 1986, pp. 134140.Google Scholar
9. Pawlewicz, W. T., Martin, P. M., Hays, D. D., and Mann, I. B. in SPIE Proceedings 325, 1982, pp. 105116.Google Scholar
10. Holland, L., Vacuum Deposition of Thin Films (John Wiley & Sons, New York, 1961).Google Scholar
11. Macleod, H. A., Thin Film Optical Filters, 2nd ed. (McGraw-Hill & Adam Hilger, 1986) pp. 410422.Google Scholar
12. Macleod, H. A. and Richmond, D., Thin Solid Films 37 (1976), pp. 163–9.Google Scholar
13. Martin, P. M., Pawlewicz, W. T., Coult, D., and Jones, J., Applied Optics 23(9) (1984), pp. 13071308.Google Scholar
14. Pawlewicz, W. T., Culver, T. R., Chiello, M. W., Zachistal, J. H., Walters, S. R., and Allen, D. A. in SPIE Proceedings 2262, 1994, pp. 212.Google Scholar
15. Griffin, J. W., Stahl, K. A., Matson, B. S., and Pawlewicz, W. T., Applied Optics 15(10) (1985), pp. 15321533.Google Scholar
16. Pawlewicz, W. T., Culver, T. R., Zachistal, J. H., Prevost, E. J., Traylor, J. D., and Wheeler, C. E. in SPIE Proceedings 1618, 1991, pp. 216.Google Scholar
17. Pawlewicz, W. T., Stewart, D. C., Gross, M. E., King, J. H., Bennett, W. D., Martin, P. M., and Johnston, J. W. in Proceedings of the Topical Meeting on High Power Laser Optical Components, Boulder CO, 1989.Google Scholar