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Properties of Thin Films After Focused Beam Processing
Published online by Cambridge University Press: 28 February 2011
Abstract
A Raman microprobe is used to detect the changes in crystallinity, stress and homogeneity on thin films of SOI irradiated by a single laser pulse. Maximum, isotropic, planar tensile stress increased from 5x109 dyn/cm2 to 12x109 dyn/cm2 in the processed area and stress of 8x109 dyn/cm2 was observed 20 μm beyond the damaged region. Crystallite sizes of 50 Å to greater than 300 Å were observed inside the processed area. Results obtained with different pulsed laser frequencies are compared and significant differences in the processing effects are observed.
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