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Profile Structures of Macromolecular Monolayers on Solid Substrates By X-Ray Interferometry/Holography

Published online by Cambridge University Press:  21 February 2011

J. Kent Blasie ,
Sontao Xu ,
Margaret Murphy ,
Janine Chupa ,
John P. McCauley ,
Amos B. Smith III ,
Lawrence J. Petacolas  and
John C. Bean
J. Kent Blasie
Affiliation:
Department of Chemistry and Laboratory for Research on the Structure of Matter, University of Pennsylvania, Philadelphia, PA 19104
Sontao Xu
Affiliation:
Department of Chemistry and Laboratory for Research on the Structure of Matter, University of Pennsylvania, Philadelphia, PA 19104
Margaret Murphy
Affiliation:
Department of Chemistry and Laboratory for Research on the Structure of Matter, University of Pennsylvania, Philadelphia, PA 19104
Janine Chupa
Affiliation:
Department of Chemistry and Laboratory for Research on the Structure of Matter, University of Pennsylvania, Philadelphia, PA 19104
John P. McCauley
Affiliation:
Department of Chemistry and Laboratory for Research on the Structure of Matter, University of Pennsylvania, Philadelphia, PA 19104
Amos B. Smith III
Affiliation:
Department of Chemistry and Laboratory for Research on the Structure of Matter, University of Pennsylvania, Philadelphia, PA 19104
Lawrence J. Petacolas
Affiliation:
Department of Chemistry and Laboratory for Research on the Structure of Matter, University of Pennsylvania, Philadelphia, PA 19104
John C. Bean
Affiliation:
AT & T Bell Laboratories, Murray Hill, NJ 07974
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Abstract

Previous work has recently employed x-ray interferometry for the unique determination of the profile structures of ultrathin Langmuir-Blodgett multilayer films of Cd-arachidate and of tethered protein monolayers on the surface of Ge/Si multilayer substrates [1, 2]. These studies utilized the inorganic substrate as the reference structure for the interferometrie phasing of the meridional x-ray diffraction I (Qxy=0A-1, QZ) from the inorganic-organic composite structure. The substrates, fabricated by magnetron sputtering, contained only broad profile features (≥20 A), thereby limiting the spatial resolution of the organic profile structures so-determined. Molecular beam epitaxy (MBE) permits the fabrication of the multilayer reference structure with profile features as narrow as a single atomic monolayer, thereby providing delta-function-like features in the reference structure. The reference structure can then be tailored such that the autocorrelation function of the inorganic-organic composite profile structure [obtained by a Fourier transform of its meridional diffraction I (Qxy=0A-1, Qz) data without phase information] contains only the organic profile structure itself over a particular range of the profile coordinate z. This approach for uniquely determining the unknown profile structure of the organic overlayer is x-ray holography by analogy to simple off-axis holography with much longer wavelength radiation. We have initially utilized MBE fabricated Ge/Si multilayer substrates of the type N(Ge2Si30), e.g., for N=2 or 3 superlattice unit cells, each containing two Ge monolayers and thirty Si monolayers, to thereby determine the profile structures of four different organic overlayers, namely a) self-assembled alkylsiloxane monolayers, b) Langmuir-Blodgett cadmium alkylcarboxylate monolayers, c) a Langmuir-Blodgett Cd-arachidate head-to-head bilayer deposited on a)-above and, d) a covalently tethered protein monolayer.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 237: Symposium Ca – Interface Dynamics and Growth , 1991 , 399
Copyright
Copyright © Materials Research Society 1992

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References

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