Hostname: page-component-848d4c4894-x5gtn Total loading time: 0 Render date: 2024-05-04T01:39:42.662Z Has data issue: false hasContentIssue false
  • English
  • Français

Precipitation of Ar, Kr and Xe in Ni at Room Temperaturey*

Published online by Cambridge University Press:  25 February 2011

A. S. Liu  and
R. C. Birtcher
A. S. Liu
Affiliation:
Materials Science Division, Argonne National Laboratory, Argonne, IL 60439
R. C. Birtcher
Affiliation:
Materials Science Division, Argonne National Laboratory, Argonne, IL 60439
Get access

Abstract

Transmission electron microscopy (TEM) has been used to study the precipitation of inert gases (Ar, Kr and Xe) injected into Ni at room temperature. The nucleation and size distribution of precipitates were found to be insensitive to the type of inert gas atom but dependent on gas concentration (ion fluence). The precipitate density decreases and the sizes increases with increasing gas concentration. In all cases, the inert gases precipitate as solid fcc crystals with their axes aligned with those of the host Ni lattice. For the same inert gas concentration, the lattice parameter is larger for the higher atomic mass in accord with bulk results. The lattice parameter of each type of inert gas precipitate increases with increasing gas concentration owing to the pressure relaxation that accompanies precipitate growth. This results in melting of large precipitates in accord with the behavior of bulk quantities of the gases at low temperatures.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 128: Symposium A – Processing and Characterization of Materials Using Ion Beams , 1988 , 303
Copyright
Copyright © Materials Research Society 1989

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

Footnotes

*

Work supported by the U. S. Department of Energy, BES-Materials Sciences, under Contract W-31-109-Eng-38.

References

REFERENCES

[1] Felde, A. vom, Fink, J., Mcrller-Heinzerling, Th., Pflcger, J., Scheerer, B. and Linker, G., Phys. Rev. Lett. 53, 922 (1984).Google Scholar
[2] Jager, W. and Roth, J., J. Nucl. Mater. 93&94, 756 (1980).Google Scholar
[3] Birtcher, R. C. and Jcger, W., Ultramicroscopy 22, 267 (1987).Google Scholar
[4] Birtcher, R. C. and Liu, A. S., in Fundamentals of Beam-Solid Interactions and Transient Thermal Processing, edited by Aziz, M. J., Rehn, L. E. and Stritzker, B. (Mater. Res. Soc. Proc. 100, Boston, MA 1987) pp. 225–230.Google Scholar
[5] Biersack, J. and Haggmark, L. G., Nucl. Instr. and Meth. 174, 257 (1980).Google Scholar
[6] Rest, J. and Birtcher, R. C., submitted to J. Nucl. Mater.Google Scholar
[7] Finger, L. W., Hazen, R. M., Zou, G., Mao, H. K. and Bell, P. M., Appl. Phys. Lett. 39, 892 (1981).CrossRefGoogle Scholar
[8] Ronchi, C., J.Nucl. Mater. 96, 314 (1981).Google Scholar