Skip to main content Accessibility help
×
×
Home

Practical Realization of Apertureless Scanning Near-field Optical Microscopy Using Hybrid Mode Atomic Force Microscopy

  • Sergey Zayats (a1) (a2), John Alexander (a1), Sergei Magonov (a1) and Dmitry Kazantsev (a3)

Abstract

The local detection of optical response at the sub-wavelength scale on a materials’ surface is an invaluable characterization capability of apertureless scanning near-field optical microscopy (ASNOM). The technique is traditionally realized in amplitude modulation (AM) AFM mode. We have expanded this method by employing an alternative scheme for the detection of the near-field and far-field responses with the use of Hybrid (HD) AFM mode. In HD mode the sample is brought to the intermittent contact with the tip in a periodic oscillation at a frequency (1-2 kHz) much smaller than the probe resonance. In every oscillation cycle the probe deflection to a set-point value is used for surface profiling. For optical measurements the metal coated AFM tip was top-illuminated by visible laser. Simultaneously with surface profiling the light scattered from tip-sample junction was collected by a sensitive photomultiplier (PMT). The homodyne optical signal detection scheme was applied to discriminate near- and far-field optical components. Our method was verified by the studies of various materials (semiconductors, metals, polymers, etc.). The presented results show that the contrast of ASNOM images can be used for compositional mapping of heterogeneous systems.

Copyright

References

Hide All
[1] Zenhausern, F., O’Boyle, M. P., and Wickramasinghe, H. K., “Apertureless near-field optical microscope,” Applied Physics Letters 65, 16231625 (1994).
[2] Zenhausern, F., Martin, Y., and Wickramasinghe, H. K., “Scanning interferometric apertureless microscopy: Optical imaging at 10 angstrom resolution,” Science 269, 10831085 (1995).
[3] Martin, Y., Zenhausern, F., and Wickramasinghe, H. K., “Scattering spectroscopy of molecules at nanometer resolution,” Applied Physics Letters 68, 24752477 (1996).
[4] Knoll, B., Keilmann, F., Kramer, A., and Guckenberger, R., “Contrast of microwave near-field microscopy,” Applied Physics Letters 70, 26672669 (1997).
[5] Hillenbrand, R., Knoll, B., and Keilmann, F., “Pure optical contrast in scattering-type scanning near-field microscopy,” Journal of Microscopy 202, 7783 (2001).
[6] Knoll, B. and Keilmann, F., “Near-field probing of vibrational absorption for chemical microscopy,” Nature 399, 134137 (1999).
[7] Wurtz, G., Bachelot, R., and Royer, P., “A reflection-mode apertureless scanning near-field optical microscope developed from a commercial scanning probe microscope,” Review of Scientific Instruments 69, 17351743 (1998).
[8] Brehm, Markus, Frey, Heinrich G., Guckenberger, Reinhard, Hillenbrand, Rainer,Kazantsev, Dimitri, Keilmann, Fritz, Ocelic, Nenad and Taubner, Thomas, “Consolidating Apertureless SNOM”, Journal of the Korean Physical Society, Vol. 47, August 2005, pp. S80↑ S85
[9] Brehm, M., Taubner, T., Hillenbrand, R., and Keilmann, F., “Infrared spectroscopic mapping of single nanoparticles and viruses at nanoscale resolution,” Nano Letters 6, 13071310 (2006).
[10] Keilmann, Fritz, Huber, Andreas J., Hillenbrand, Rainer, “Nanoscale Conductivity Contrast by Scattering-Type Near-Field Optical Microscopy in the Visible, Infrared and THz Domains”, J Infrared Milli Terahz Waves (2009) 30:12551268
[11] Huber, Andreas J., Kazantsev, Dmitry, Keilmann, Fritz, Wittborn, Jesper and Hillenbrand, Rainer, “Simultaneous IR Material Recognition and Conductivity Mapping by Nanoscale Near-Field Microscopy”, Advanced Materials, 19, 22092212 (2007)
[12] Labardi, M., Patan`e, S., and Allegrini, M., “Artifact-free near-field optical imaging by apertureless microscopy,” Applied Physics Letters 77, 621623 (2000).
[13] Novotny, L. and van Hulst, N., “Antennas for light,” Nature Photonics 5, 8390 (2011).
[14] Esteban, R., Vogelgesang, R., Dorfmüller, J., Dmitriev, A., Rockstuhl, C., Etrich, C., and Kern, K., “Direct near-field optical imaging of higher order plasmonic resonances,” Nano Letters 8, 31553159 (2008).
[15] Stiegler, J. M., Abate, Y., Cvitkovic, A., Romanyuk, Y. E., Huber, A. J., Leone, S. R., and Hillenbrand, R., “Nanoscale infrared absorption spectroscopy of individual nanoparticles enabled by scattering-type near-field microscopy,” ACS Nano 5, 64946499 (2011).
[16] Esslinger, M., Dorfm¨uller, J., Khunsin, W., Vogelgesang, R., and Kern, K., “Background-free imaging of plasmonic structures with cross-polarized apertureless scanning near-field optical microscopy,” Review of Scientific Instruments 83, 033704 (2012).
[17] Maghelli, N., Labardi, M., Patan`e, S., Irrera, F., and Allegrini, M., “Optical near-field harmonic demodulation in apertureless microscopy,” Journal of Microscopy 202, 8493 (2001).
[18] Bek, A., Vogelgesang, R., and Kern, K., “Apertureless scanning near field optical microscope with sub-10 nm resolution,” Review of Scientific Instruments 77, 043703 (2006).
[19] Taubner, T., Hillenbrand, R. and Keilmann, F., “Performance of visible and mid-infrared scattering-type near-field optical microscopy”, Journal of Microscopy, Vol. 210, Pt 3 June 2003, pp. 311314.
Recommend this journal

Email your librarian or administrator to recommend adding this journal to your organisation's collection.

MRS Online Proceedings Library (OPL)
  • ISSN: -
  • EISSN: 1946-4274
  • URL: /core/journals/mrs-online-proceedings-library-archive
Please enter your name
Please enter a valid email address
Who would you like to send this to? *
×

Keywords

Metrics

Full text views

Total number of HTML views: 0
Total number of PDF views: 0 *
Loading metrics...

Abstract views

Total abstract views: 0 *
Loading metrics...

* Views captured on Cambridge Core between <date>. This data will be updated every 24 hours.

Usage data cannot currently be displayed