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Piezoresponse Force Microscopy Characterization of PTO Thin Films

  • Alessio Morelli (a1), Sriram Venkatesan (a2), George Palasantzas (a3), Bart J. Kooi (a4) and Jeff De Hosson (a5)...

Abstract

The piezoelectric properties of PTO thin films grown by pulsed laser deposition are investigated with piezoresponse force microscopy and transmission electron microscopy. The as-grown films exhibit upward polarization, and inhomogeneous distribution of piezoelectric characteristics. The data obtained reveal imprint during piezoresponse force microscopy measurements, nonlinearity in the piezoelectric deformation, and limited retention loss. Moreover, transmission electron microscopy shows the presence of defects near the film/substrate interface, which can be associated with the variations of piezoelectric properties.

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Keywords

Piezoresponse Force Microscopy Characterization of PTO Thin Films

  • Alessio Morelli (a1), Sriram Venkatesan (a2), George Palasantzas (a3), Bart J. Kooi (a4) and Jeff De Hosson (a5)...

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