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Physical Characterization of Zirconium Doped Zinc Oxide Thin Firms Deposited by Spray Pyrolysis

Published online by Cambridge University Press:  10 February 2011

A. Maldonado
Affiliation:
Instituto de Física, UNAMN; A.P. 20-364; 01000 México D.F., Mexico
D.R. Acosta
Affiliation:
Instituto de Física, UNAMN; A.P. 20-364; 01000 México D.F., Mexico
M. De La Luz Olvera
Affiliation:
CINVESTAV, Dpto. de Imgeniería Eléctrica, A.P. 14-740, 07000 México D.F.
R. Castanedo
Affiliation:
Laboratorio de Investigación en Materiales, CINVESTAV-IPN, Centro Universitario Querétaro, Mexico
G. Torres
Affiliation:
Laboratorio de Investigación en Materiales, CINVESTAV-IPN, Centro Universitario Querétaro, Mexico
J.Cañetas Ortega
Affiliation:
CINVESTAV, Dpto. de Imgeniería Eléctrica, A.P. 14-740, 07000 México D.F.
R. Asomoza
Affiliation:
CINVESTAV, Dpto. de Imgeniería Eléctrica, A.P. 14-740, 07000 México D.F.
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Abstract

Zinc oxide thin films doped with zirconium were prepared from solutions with doping material dispersed at several concentrations and using the spray pyrolysis technique.The films were deposited over sodocalcic glasses at different substrate temperatures. Effects of doping material concentration and substrate temperatures on electrical, optical, structural and morphological film properties are presented. Results show an evolution in morphology and grains size as the doping concentration is increased. Preferential growth in the (002) orientation was detected for each thin film from X ray diffractograms.

Type
Research Article
Copyright
Copyright © Materials Research Society 1998

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References

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