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Photoluminescence Study of Thermally Treated Silicon Crystals

  • J. Weber (a1) and R. Sauer (a1)


Cz silicon samples heated to 450 ° C or higher temperatures for several hours exhibit many sharp photoluminescence lines well below the band edge. We study the production of the lines in terms of carbon and oxygen doping and of the heating temperature and duration. First results as to a level scheme of the P (0.7672 eV) line are reported.



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