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A Photoemission Study of Electrochemically Etched Light Emitting Silicon

  • Jeff Terry (a1), H. Liu (a2), R. Cao (a1), J. C. Woicik (a1), P. Pianetta (a1), X. Yang (a1), J. Wu (a1), M. Richter (a1), N. Maluf (a3), F. Pease (a3), A. Dillon (a4), M. Robinson (a4) and S. George (a4)...

Abstract

The valence band and the Si 2p core level of electrochemically etched light emitting porous silicon samples prepared with different etching parameters and upon thermal annealing have been studied. The core level shows appreciable broadening as chemical etching time increases. Upon annealing, the core level linewidth decreases and the valence band develops spectral features. The photoluminescence intensity, also, decreases upon annealing. However, impurity species are found to be present only in trace amounts. Our data is consistent with a photoluminescence mechanism involving a silicon species that degrades, decomposes, or desorbs upon annealing.

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A Photoemission Study of Electrochemically Etched Light Emitting Silicon

  • Jeff Terry (a1), H. Liu (a2), R. Cao (a1), J. C. Woicik (a1), P. Pianetta (a1), X. Yang (a1), J. Wu (a1), M. Richter (a1), N. Maluf (a3), F. Pease (a3), A. Dillon (a4), M. Robinson (a4) and S. George (a4)...

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