Skip to main content Accessibility help
×
Home

Photoemission Characterization of Thin Film Nucleation on Inert Substrates

  • G. Haugstad (a1), A. Raisanen (a1), C. Caprile (a1), X. Yu (a1) and A. Franciosi (a1)...

Abstract

Synchrotron radiation photoemission was used to characterize Sm and Mn thin film nucleation and growth on solid Xe substrates, in the 3×1014 - 2×1016 atoms/cm2 coverage range. Film growth is well approximated by a model in which the nucleation site density remains constant and hemi-ellipsoidal particles increase in size until coalescence is achieved. Site density and average cluster size are determined from the coverage-dependence of metal and Xe photoemission intensities. Size estimates are confirmed by experimental fingerprints of coalescence.

Copyright

References

Hide All
1. DiCenzo, S.B. and Wertheim, G. K., Comments Solid State Phys. 11, 203 (1985).
2. Raaen, S., Davenport, J. W. and Strongin, M., Phys. Rev. B 33, 4360 (1986)
3. Qiu, S. L., Pan, X., Strongin, M. and Citrin, P. H., Phys. Rev. B 36, 1292 (1987)
4. Haugstad, G., Caprile, C., Franciosi, A., Wieliczka, D. M. and Olson, C. G., Phys. Rev. B (in press)
5. Waddill, G. D., Vitromirov, I. M., Aldao, C. M and Weaver, J. H., Phys. Rev. Lett. 62, 1568 (1989)
6. Bienfait, M., Surf. Sci 162, 411 (1985)
7. Eckertova, L., Physics of Thin Films (Plenum Press, New York, 1977)
8. Wall, A., Chang, S. Philip, P., Caprile, C. and Franciosi, A., J. Vac. Sci. Technol. A 5, 2051 (1987)
9. Haugstad, G. and Franciosi, A. (to be published)

Related content

Powered by UNSILO

Photoemission Characterization of Thin Film Nucleation on Inert Substrates

  • G. Haugstad (a1), A. Raisanen (a1), C. Caprile (a1), X. Yu (a1) and A. Franciosi (a1)...

Metrics

Full text views

Total number of HTML views: 0
Total number of PDF views: 0 *
Loading metrics...

Abstract views

Total abstract views: 0 *
Loading metrics...

* Views captured on Cambridge Core between <date>. This data will be updated every 24 hours.

Usage data cannot currently be displayed.