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Phase and Morphology in Mixed CuO-WO3 Films for Chemical Sensing

Published online by Cambridge University Press:  11 February 2011

A. El Madi
Affiliation:
Dept. of Chemistry, University of Maine, Orono, ME 04469 Laboratory for Surface Science and Technology (LASST), University of Maine, Orono, ME 04469
B. Meulendyk
Affiliation:
Dept. of Physics, and, University of Maine, Orono, ME 04469 Laboratory for Surface Science and Technology (LASST), University of Maine, Orono, ME 04469
R. S. Pilling
Affiliation:
Dept. of Chemistry, University of Maine, Orono, ME 04469 Laboratory for Surface Science and Technology (LASST), University of Maine, Orono, ME 04469
G. Bernhardt
Affiliation:
Dept. of Physics, and, University of Maine, Orono, ME 04469 Laboratory for Surface Science and Technology (LASST), University of Maine, Orono, ME 04469
R. J. Lad
Affiliation:
Dept. of Physics, and, University of Maine, Orono, ME 04469 Laboratory for Surface Science and Technology (LASST), University of Maine, Orono, ME 04469
B. G. Frederick
Affiliation:
Dept. of Chemistry, University of Maine, Orono, ME 04469 Laboratory for Surface Science and Technology (LASST), University of Maine, Orono, ME 04469
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Abstract

Semiconducting metal oxide (SMO) chemiresistive sensors are highly sensitive toward a broad range of hydrocarbons. To develop a gas phase sensor with selectivity toward organophosphorus compounds, such as chemical warfare agents and pesticides, we have developed dosimeters based upon a poisoning mechanism. Here, we report the growth and characterization of WO3 thin films, modified with Cu2O. XPS data show that exposure to phosphonate compounds leads to accumulation of phosphate on the surface, together with dramatic changes in the surface segregation of copper. We present XRD and XPS results to characterize the phase changes following growth, annealing, and exposure to phosphonate compounds. The correlation between sensor response and phosphorous accumulation shows that the highest activity occurs at intermediate coverages of Cu2O, in the15–25 Å range, on 500 Å WO3 films.

Type
Research Article
Copyright
Copyright © Materials Research Society 2003

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