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Oriented Film Growth of Organic Semiconductor Sexithiophene on Artificial Periodic Grooves and Electrical Conduction Properties of the Films

Published online by Cambridge University Press:  01 February 2011

Susumu Ikeda
Affiliation:
ikeda@epi.k.u-tokyo.ac.jp, The University of Tokyo, Department of Complexity Science and Engineering, Graduate School of Frontier Sciences, Kashiwanoha 5-1-5, Kashiwa, 277-8561, Japan, +81-4-7136-3907, +81-4-7136-3907
Yasuo Wada
Affiliation:
y-wada@toyonet.toyo.ac.jp, Toyo University, Graduate School of Interdisciplinary New Science, 2100 Kujirai, Kawagoe, 350-8585, Japan
Katsuhiko Inaba
Affiliation:
inaba@rigaku.co.jp, Rigaku Corporation, X-ray Research Laboratory, 3-9-12 Matsubara-cho, Akishima, 196-8666, Japan
Kazuo Terashima
Affiliation:
kazuo@plasma.k.u-tokyo.ac.jp, The University of Tokyo, Department of Advanced Materials Science, Graduate School of Frontier Sciences, Kashiwanoha 5-1-5, Kashiwa, 277-8561, Japan
Toshihiro Shimada
Affiliation:
shimada@chem.s.u-tokyo.ac.jp, The University of Tokyo, Department of Chemistry, School of Science, 7-3-1 Hongo, Bunkyo-ku, Tokyo, 113-0033, Japan
Koichiro Saiki
Affiliation:
saiki@k.u-tokyo.ac.jp, The University of Tokyo, Department of Complexity Science and Engineering, Graduate School of Frontier Sciences, Kashiwanoha 5-1-5, Kashiwa, 277-8561, Japan
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Abstract

Film growth of organic semiconductor α-sexithiophene (6T) was studied using substrates with artificial periodic grooves. The grooves were fabricated on thermally oxidized silicon substrates by electron beam lithography. Based on the orientation analysis by atomic force microscopy and grazing-incidence x-ray diffraction, part of the 6T grains grew having the in-plane orientational relationship with the artificial grooves. This phenomenon corresponds to “ggraphoepitaxy” which has been well known in inorganic materials research field. As well as the in-plane preferred orientation, one-dimensional structure consisting of connected 6T grains was observed. The electrical conduction properties of the films were also evaluated.

Type
Research Article
Copyright
Copyright © Materials Research Society 2008

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References

REFERENCES

1. Dimitrakopoulos, C. D and Malenfant, P. R. L., Adv. Mater. 14, 99 (2002).Google Scholar
2. Takeya, J., Yamagishi, M., Tominari, Y., Hirahara, R., and Nakazawa, Y., Nishikawa, T., Kawase, T., Shimoda, T., and Ogawa, S., Appl. Phys. Lett. 90, 102120 (2007)Google Scholar
3. Chwang, A. B and Frisbie, C. D, J. Appl. Phys. 90, 1342 (2001).Google Scholar
4. Xu, M., Nakamura, M., Sakai, M., and Kudo, K., Adv. Mater. 19, 371 (2007).Google Scholar
5. Smith, H. I and Flanders, D. C, Appl. Phys. Lett. 32, 349 (1978).Google Scholar
6. Geis, M. W, Flanders, D. C, and Smith, H. I, Appl. Phys. Lett. 35, 71 (1979).Google Scholar
7. Smith, H. I, Geis, M. W, Thompson, C.V., and Atwater, H. A, J. Cryst. Growth 63, 527 (1983).Google Scholar
8. Cheng, J. Y, Ross, C. A, Thomas, E. L, Smith, H. I, and Vancso, G. J, Appl. Phys. Lett. 81, 36573659 (2002).Google Scholar
9. Garcia, R., Tello, M., Moulin, J. F, and Biscarini, F., Nano Lett. 4, 11151119 (2004).Google Scholar
10. Yasseri, A. A, Sharma, S. Kamins, T. I, Xia, Q., Chou, S. Y, and Pease, R. F. W., Appl. Phys. Lett. 89, 153121 (2006).Google Scholar
11. Ito, Y., Inaba, K., Omote, K., Wada, Y., and Ikeda, S., Jpn. J. Appl. Phys. 46, L773–L775 (2007).Google Scholar
12. Horowitz, G., Bachet, B., Yassar, A., Lang, P., Demanze, F., Fave, J.-L., and Garnier, F., Chem. Mater. 7, 1337 (1995).Google Scholar
13. Kubono, A. and Akiyama, R., J. Appl. Phys. 98, 093502 (2005).Google Scholar
14. Ikeda, S., Saiki, K., Tsutsui, K., Edura, T., Wada, Y., Miyazoe, H., Terashima, K., Inaba, K., Mitsunaga, T., and Shimada, T., Appl. Phys. Lett. 88, 251905 (2006).Google Scholar
15. Ikeda, S., Saiki, K., Wada, Y., Inaba, K., Ito, Y., Kikuchi, H., Terashima, K., and Shimada, T., J. Appl. Phys., to be published.Google Scholar