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Optimization of x-ray Techniques for Nondestructive Characterization of Single Crystal Turbine Blades

Published online by Cambridge University Press:  10 February 2011

J.M. Winter Jr. ,
K.G. Lipetzky  and
R.E. Green Jr.
J.M. Winter Jr.
Affiliation:
Center for Nondestructive Evaluation, Johns Hopkins University, Baltimore, MD, 21218
K.G. Lipetzky
Affiliation:
Center for Nondestructive Evaluation, Johns Hopkins University, Baltimore, MD, 21218
R.E. Green Jr.
Affiliation:
Center for Nondestructive Evaluation, Johns Hopkins University, Baltimore, MD, 21218
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Abstract

This paper describes nondestructive x-ray characterization techniques which detect macroscopic and microscopic defects, determine the overall crystallographic perfection, and detect any unwanted secondary crystals both on the external surface as well as in the interior of single crystal blades. The method of Asymmetric Crystal Topography for diffraction imaging the surfaces of single crystal turbine blades and the method of White Beam Transmission Topography for diffraction imaging through the thickness of single crystal turbine blades are both discussed and illustrated with representive diffraction images (topographs). It is clear that the images gained from these methods have a capability for providing information about the details of crystalline perfection (or lack thereof) in nickel-based alloy single crystal turbine blades. Such information can provide considerable leverage for the crystal grower to help in adjusting processing variables to enhance quality of a critical product. And the same methods of topography can conceiveably provide tools for evaluating the finished product in a way which has not been available to date.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 591 , 1999 , 3
Copyright
Copyright © Materials Research Society 2000

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References

REFERENCES

1.Green, R. Jr., Winter, J. Jr., Lipetzky, K., in Nondestructive Evaluation (NDE) and Materials Propertiesv, IV. edited by Liaw, P., Arsenault, R., Green, R. Jr., Murty, K., Thompson, R., (The Minerals, Metals, and Materials Society, Warrendale, PA, 1999), p 21.Google Scholar
2.Winter, J. Jr., Green, R. Jr., Advances in X-Jay Analysis, 38, edited by Predicki, P., Bowen, D., Gilfrich, J., Goldsmith, C., Huang, T., et al. , (Plenum Press, N.Y., 1995), p. 215.Google Scholar
3.Winter, J. Jr., Green, R. Jr., Strabel, G., Nondestructive Characterization of Materials, VIII, edited by Green, R. Jr., (Plenum Press, N.Y., 1998), p 431.Google Scholar