Skip to main content Accessibility help
×
Home

Optical Properties of Amorphous Silicon-Yttrium Films

  • Shmyryeva Alexandra N. (a1) and Semikina Tetyana V. (a2)

Abstract

This paper presents and discusses the results of measuring IR reflection and ellipsometric parameters, optical microscopy and AFM the mixed phase of amorphous Si:Y films with microcrystalline inclusions. These films were obtained by electron-beam evaporation of siliconyttrium alloys with different Y concentration (5-30 %) at two substrate temperatures (370 and 620 °C).

Copyright

References

Hide All
1 Afanasiev, V. P., Gudovskikh, A. S., Kazak-Kazakevich, A. Z. et al., J. Semiconductors 38, 221224 (2004).10.1134/1.1648381
2 Afanasiev, V.P., Gudovskikh, A.S., Nevedomskiy, V.N. et al, J. Semiconductors 36, 230234 (2002).10.1134/1.1453445
3 Golikova, O.A., Kazanin, M.M., Kuznecov, A.N. and Bogdanova, Y.V., J. Semiconductors 34, 10851089 (2000).10.1134/1.1309428
4 Green, M.A., J. Solar Energy 74, 181192 (2003).10.1016/S0038-092X(03)00187-7
5 Shmyryeva, A.N., Semikina, T.V., Dushejko, M.G., and Bishena, N., Book of Abstracts. Russian Symposium of Amorphous and Single Crystal Semiconductor. St-Petersburg, 144 (1998) (in Russian).
6 Shmyryeva, A.N., Semikina, T.V., and Dushejko, M.G., Book of Abstracts of the Second Russian Conference (“Silicon-2000”), Moscow, 911 of February, 374-376 (2000) (in Russian).
7 Kurova, I.A., Ormont, N.N., Terukov, E.I., Trapeznikova, I.N., Afanasev, V.P. and Gudovskikh, A.S., J. Semiconductors 35, 353356 (2001).10.1134/1.1356161

Related content

Powered by UNSILO

Optical Properties of Amorphous Silicon-Yttrium Films

  • Shmyryeva Alexandra N. (a1) and Semikina Tetyana V. (a2)

Metrics

Full text views

Total number of HTML views: 0
Total number of PDF views: 0 *
Loading metrics...

Abstract views

Total abstract views: 0 *
Loading metrics...

* Views captured on Cambridge Core between <date>. This data will be updated every 24 hours.

Usage data cannot currently be displayed.