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Optical Characterization of Individual Nanostructures by STM Light Emission

  • S. Ushioda (a1)


Visible light is emitted when electrons (holes) are injected into a sample from the tip of the scanning tunneling microscope (STM). By analyzing the spectra of the emitted light, one can not only determine the surface geometry by usual STM imaging, but also learn the electronic and optical properties of specific individual nanostructures. This technique has been applied to investigate the electronic transitions of individual protrusions of porous Si and semiconductor quantum wells of AlGaAs/GaAs. The usefulness, limitations, and future expectations of this novel technique are discussed.



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1. Gimzewski, J. K., Reihl, B., Coombs, J. H., and Schlittler, R. R., Z. Phys. B72, 497 (1988) and J. H. Coombs, J. K. Gimzewski, B. Reihl, J. K. Sass, and R. R. Schlittler, J. Microsc. 152, 325 (1988).
2. See for example: Uehara, Y., Fujita, T., and Ushioda, S., Phys. Rev. Lett., 83 (1999) 2445; A. Downes and M. E. Welland, Phys. Rev. Lett. 81, 1857 (1998); Z. Wu, T. Nakayama, S. Qiao, and M. Aono, Appl. Phys. Lett. 73, 2269 (1998); R. Berndt, R. Gaisch, W. D. Schneider, J. K. Gimzewski, B. Reihl, R. R. Schlittler, and M. Tschudy, Phys. Rev. Lett. 74, 102 (1995); P. Renaud and S. F. Alvarado, Phys. Rev. B44, 6340 (1991).
3. Ito, K. J., Ito, K., Uehara, Y., and Ushioda, S., Rev. Sci. Instrum. (in press for Feb., 2000).
4. Arafune, R., Sakamoto, K., and Ushioda, S., (to be published).
5. See for example: Abraham, D. L., Veider, A., Schonenberger, Ch., Meier, H. P., Arent, D. J., and Alvarado, S. F., Appl. Phys. Lett. 56, 1564(1990), and R. Berndt and J. K. Gimzewski, Phys. Rev. B45, 14095 (1992).
6. Canham, L. T., Appl. Phys. Lett., 57 (1990) 1046, and A. G. Cullis and L. T. Canham, Nature 353 (1991) 335.
7. Ito, K., Ohyama, S., Uehara, Y., and Ushioda, S., Appl. Phys. Lett., 67 (1995) 2536.
8. Dumas, Ph., Gu, M., Syrykh, C., Gimzewski, J. K., Makarenko, I., Halimaoui, A., and Salvan, F., Europhys. Lett. 23, 197(1993).
9. Ph. Dumas, Gu, M., Syrykh, C., Hallimaoui, A., Salvan, F., Gimzewski, J. K., and Schlittler, R. R., J. Vac. Sci. 12, 2064(1994).
10. Delly, B. and Steigmeier, E. F., Phys. Rev., B47 (1993) 1397.
11. Alvarado, S. F., Renaud, Ph., Abraham, D. L., Schönenberger, Ch., Arent, D. J., and Meier, H. P., J. Vac. Sci. Technol., B9 (1991) 409, D. L. Abraham, A. Veider, Ch. Schonenberger, H. P. Meier, D. J. Arent, and S. F.Alvarado, J. Vac. Sci. 9, 409(1991).
12. Tsuruoka, T., Ohizumi, Y., Ushioda, S., Ohno, Y., and Ohno, H., Appl. Phys. Lett., 73 (1998) 1544.
13. Tsuruoka, T., Ohizumi, Y., Tanimoto, R., and Ushioda, S., Appl. Phys. Lett. 75, 2289(1999).

Optical Characterization of Individual Nanostructures by STM Light Emission

  • S. Ushioda (a1)


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