Hostname: page-component-7bb8b95d7b-s9k8s Total loading time: 0 Render date: 2024-09-26T03:34:56.210Z Has data issue: false hasContentIssue false

Observations Of Grain Growth In Thin Films

Published online by Cambridge University Press:  25 February 2011

D. A. Smith
Affiliation:
IBM Research Division, T.J.Watson Research Center, Yorktown Heights, NY10.598.
S. J. Townsend
Affiliation:
Departmcnt of Materials Science and engineering, Cornell University, IthacaNY14853.
C. S. Nichols
Affiliation:
Departmcnt of Materials Science and engineering, Cornell University, IthacaNY14853.
Get access

Abstract

Grain growth occurs during the deposition and subsequent processing of metallic films. Observation of the grain structure by scanning ion probe microscopy and grain growth by in situ transmission electron microscopy using a heating stage serves to define some characteristic grain structures and their evolution in pure metal and alloy films used for metallisation.

Type
Research Article
Copyright
Copyright © Materials Research Society 1992

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1.Interface Migration and the Control of MicrostructureASM, Metals Park OH, King, A.H., Pandc, C.S. and Smith, D.A. editors, (1984).Google Scholar
2. Weaire, D. and Rivier, N.; Contemp. Phys. 25 (1984).59 Google Scholar
3. Mullins, W.W.; Acta Metall 27 (1956) 900 Google Scholar
4. Walton, D.T., Frost, H.J. and Thompson, C.V.; Appl. Phys. Lett, submitted (1991)Google Scholar
5. Grovenor, C.R.M., Hcntzell, H.T.G. and Smith, D.A.; Acta Metall 32 (1984) 773 Google Scholar
6. D'Heurle, F.M. and Rosenberg, R. in Physics of Thin Films. lass, E.I. editor, 7 (1973) 243 Academic Press New York. Google Scholar
7. Cahn, R.W. in Physical Metallurgy, Cahn, R.W. and Haascn, P. editor, (1983) 1658, North Holland, Amsterdam, Netherlands. Google Scholar