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Observation of the Early Stages of B-Axis Oriented Prba2Cu3O7-x Thin Film Growth by AFM

Published online by Cambridge University Press:  21 February 2011

Gun Yong Sung
Affiliation:
Electronics and Telecommunications Research institute, P.O.Box 106, Yusong, Taejon, 305-600, REP. of KOREA
Jeong Dae Suh
Affiliation:
Electronics and Telecommunications Research institute, P.O.Box 106, Yusong, Taejon, 305-600, REP. of KOREA
Sang-Don Jung
Affiliation:
Electronics and Telecommunications Research institute, P.O.Box 106, Yusong, Taejon, 305-600, REP. of KOREA
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Abstract

The initial stages of the growth of b-axis oriented PrBa2Cu3O7-x (PBCO) films on LaSrGaO4 (100) substrates were investigated by atomic force microscopy to follow the growth of the thin films. Series of films with thickness ranging between 0.34 nm and 100 nm were prepared under identical pulsed laser deposition conditions. No sprial-topped or flat-topped islands were observed and the scale of the surface roughness was lower than that of the c-axis oriented growth mode. the 300 nm-thick in-plane aligned a-axis oriented YBCO films have the root mean square (RMS) surface roughness of 2 nm. It is considered that the b-axis oriented PBCO films on LaSrGaO4 (100) substrates were nucleated and grown by layer-by-layer like growth mode.

Type
Research Article
Copyright
Copyright © Materials Research Society 1995

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