Hostname: page-component-76fb5796d-22dnz Total loading time: 0 Render date: 2024-04-26T09:59:55.008Z Has data issue: false hasContentIssue false
  • English
  • Français

Non-Vacuum Deposition of Buffer Layer for YBCO Superconductor Oxide Films

Published online by Cambridge University Press:  01 February 2011

Raghu Bhattacharya ,
Sovannary Phok ,
Priscila Spagnol  and
Tapas Chaudhuri
Raghu Bhattacharya
Affiliation:
National Renewable Energy Laboratory, 1617 Cole Blvd., Golden, CO 80401, USA
Sovannary Phok
Affiliation:
National Renewable Energy Laboratory, 1617 Cole Blvd., Golden, CO 80401, USA
Priscila Spagnol
Affiliation:
National Renewable Energy Laboratory, 1617 Cole Blvd., Golden, CO 80401, USA
Tapas Chaudhuri
Affiliation:
National Renewable Energy Laboratory, 1617 Cole Blvd., Golden, CO 80401, USA
Get access

Abstract

Nonvacuum electrodeposition was used to prepare biaxially textured CeO2 and Sm-doped CeO2 coatings on Ni-W substrates. The samples were characterized by X-ray diffraction (including Θ/2Θ, pole figures, omega scans, and phi scans), atomic force microscopy, and Auger electron spectroscopy (AES). Pole-figure scans show that electrodeposited CeO2 and Sm-doped CeO2 on textured Ni-W (3 at.%) is cube textured. Full-width at half-maximum values of thew scan andf scan of the electrodeposited layers were better than those of the Ni-W base substrates, indicating improved biaxial texturing of the electrodeposited layers. AES analysis of the YBCO/CeO2/YSZ/ED-CeO2/Ni-W revealed that Ni interdiffusion was completely stopped at the first electrodeposited CeO2 layer.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 868: Symposium C – Recent Advances in Superconductivity - Materials Synthesis, Multiscale Characterization and Functionally Layered Composite Conductors , 2005 , C6.7
Copyright
Copyright © Materials Research Society 2005

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1 Norton, D.P., Goyal, A., Budai, J.D., Christen, D.K., Kroeger, D.M., Specht, E.D., He, Q., Saffian, B., Paranthaman, M., Klabunde, C.E., Lee, D.F., Sales, B.C., and List, F., Science 274, 755 (1996)Google Scholar
2 Mathis, J.E., Goyal, A., Lee, D.F., List, F.A., Paranthaman, M., Christen, D.K., Specht, E.D., Kroeger, D.M., and Martin, P.M., Jpn J. Appl. Phys. 37, L1379 (1998).Google Scholar
3 Park, C., Norton, D.P, Verebelyi, D.T., Christen, D.K., Budai, J.D., Lee, D.F., and Goyal, A., Appl. Phys. Lett. 76, 2427 (2000).Google Scholar
4 Bhattacharya, R. N., Chen, J., Spagnol, P., and Chaudhuri, T., J. Electrochem. Soc. 7, No. 11, (2004).Google Scholar
5 Chen, J., Spagnol, P., Bhattacharya, R.N., and Ren, Z.F., J. Phys. D. 37, 2623 (2004).Google Scholar