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Non-Destructive Characterization of Semiconductors Using Organic Thin Films
Published online by Cambridge University Press: 26 February 2011
Abstract
Rectifying junctions prepared by vacuum deposition of 3,4,9,10-perylenetetracarboxylic dianhydride (PTCDA) and related compounds on both p- and n-type inorganic semiconducting wafers are used for their non-destructive evaluation. By evaporation of metal contact pads onto the organic layer, we can probe many of the fundamental -bulk and surface properties of the semiconductor.
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- Copyright © Materials Research Society 1986