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New Instrumentation in Argonne's Hvem-Tandem Facility: Expanded Capability for in Situ Ion Beam Studies+

Published online by Cambridge University Press:  21 February 2011

Charles W. Allen ,
Loren L. Funk  and
Edward A. Ryan
Charles W. Allen
Affiliation:
Materials Science Division, Argonne National Laboratory, Argonne, IL 60439
Loren L. Funk
Affiliation:
Materials Science Division, Argonne National Laboratory, Argonne, IL 60439
Edward A. Ryan
Affiliation:
Materials Science Division, Argonne National Laboratory, Argonne, IL 60439
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Abstract

During 1995, a state-of-the-art intermediate voltage electron microscope (IVEM) has been installed in the HVEM-Tandem Facility with in situ ion irradiation capabilities similar to those of the HVEM. A 300 kV Hitachi H-9000NAR has been interfaced to the two ion accelerators of the Facility, with a spatial resolution for imaging which is nearly an order of magnitude better than that for the 1.2 MV HVEM which dates from the early 1970s. The HVEM remains heavily utilized for electron- and ion irradiation-related materials studies, nevertheless, especially those for which less demanding microscopy is adequate. The capabilities and limitations of this IVEM and HVEM are compared. Both the HVEM and IVEM are part of the DOE funded User Facility and therefore are available to the scientific community for materials studies, free of charge for non-proprietary research.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 396: Symposium A – Ion-Solid Interactions for Materials Modification and Processing , 1995 , 641
Copyright
Copyright © Materials Research Society 1996

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