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Nanoscale scanning near-field ellipsometric microscopy (SNEM) imaging of heterogeneous polymers

  • Aysegul Cumurcu (a1), Joost Duvigneau (a1), Ian D. Lindsay (a2), Peter Schön (a1) and G. Julius Vancso (a1)...

Abstract

In this study a scanning near-field ellipsometric microscope (SNEM), a hybrid device of an atomic force microscope (AFM) and an ellipsometer, is used to obtain optical images of heterogeneous polymer thin films with a resolution below the diffraction limit of light. SNEM optical images of a microphase separated PS-b-P2VP block copolymer film collected with gold coated and bare silicon AFM probe tips were compared to obtain a deeper insight into the nature of the SNEM contrast mechanism. Furthermore, intensity vs. distance curves were recorded on a PS-b-PMMA block copolymer film simultaneously during the acquisition of force-displacement curves to study the far-field contribution of the optical signal to the optical image.

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*Corresponding author: Prof. G. Julius Vancso, Tel: +31(0)53-4892967 Fax: +31 (0)53 489 3823 E-mail: g.j.vancso@utwente.nl

References

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Nanoscale scanning near-field ellipsometric microscopy (SNEM) imaging of heterogeneous polymers

  • Aysegul Cumurcu (a1), Joost Duvigneau (a1), Ian D. Lindsay (a2), Peter Schön (a1) and G. Julius Vancso (a1)...

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