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Nanoelectromechanics of Piezoresponse Force Microscopy: Contact Properties, Fields Below the Surface and Polarization Switching

Published online by Cambridge University Press:  01 February 2011

S. V. Kalinin ,
Junsoo Shin ,
M. Kachanov ,
E. Karapetian  and
A. P. Baddorf
S. V. Kalinin
Affiliation:
Condensed Matter Sciences Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831
Junsoo Shin
Affiliation:
Condensed Matter Sciences Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831 Department of Physics and Astronomy, The University of Tennessee, Knoxville, TN 37996
M. Kachanov
Affiliation:
Department of Mechanical Engineering, Tufts University, Medford, MA 02155
E. Karapetian
Affiliation:
Department of Mechanical Engineering, Tufts University, Medford, MA 02155
A. P. Baddorf
Affiliation:
Condensed Matter Sciences Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831
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Abstract

To achieve quantitative interpretation of Piezoresponse Force Microscopy (PFM), including resolution limits, tip bias- and strain-induced phenomena and spectroscopy, knowledge of elastic and electrostatic field distributions below the tip is required. The exact closed form solution of the coupled electroelastic problem for piezoelectric indentation is derived and used to obtain the tip-induced electric field and strain distribution in the ferroelectric material. This establishes a complete continuum mechanics description of the PFM imaging mechanism. These solutions are reduced to the point charge/force behavior for large separations from contact, and the applicability limits and charge/force magnitude for these models are established. The implications of these results for ferroelectric polarization switching processes are analyzed.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 784: Symposium C – Ferroelectric Thin Films XII , 2003 , C2.6
Copyright
Copyright © Materials Research Society 2004

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References

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