Hostname: page-component-8448b6f56d-xtgtn Total loading time: 0 Render date: 2024-04-18T11:23:46.908Z Has data issue: false hasContentIssue false

Modification of Electrical and Mechanical Properties of Single Wall Carbon Nanotubes by Reaction with SOCl2

Published online by Cambridge University Press:  15 February 2011

Urszula Dettlaff-Weglikowska
Affiliation:
Max-Planck-Institute for Solid State Research, Heisenberg Str. 1, 70569 Stuttgart, Germany
Viera Skakalova
Affiliation:
Max-Planck-Institute for Solid State Research, Heisenberg Str. 1, 70569 Stuttgart, Germany
Ralf Graupner
Affiliation:
Institute of Technical Physics, University of Erlangen, Erwin-Rommel Str. 1, 91058 Erlangen, Germany
Lothar Ley
Affiliation:
Institute of Technical Physics, University of Erlangen, Erwin-Rommel Str. 1, 91058 Erlangen, Germany
Siegmar Roth
Affiliation:
Max-Planck-Institute for Solid State Research, Heisenberg Str. 1, 70569 Stuttgart, Germany
Get access

Abstract

Attaching chemical functional groups to single wall carbon nanotubes (SWNTs) has been achieved by chemical methods. Oxidized purified nanotubes have been treated by thionyl chloride in order to convert carboxyl groups into acylchloride groups. We observe by XPS and EDX that not only chlorine atoms but sulphur containing functional groups are covalently bound to the nanotubes. This chemical functionalization also causes significant changes in the electrical and mechanical properties of the nanotubes. The electrical conductivity measured on mats (bucky paper) increases from 500 S/cm in pristine tubes to 2500 S/cm in modified tubes. Similarly, the Young's modulus of bucky paper increases by about 100 %.

Type
Research Article
Copyright
Copyright © Materials Research Society 2003

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Chiu, P. W., Duesberg, G. S., Dettlaff-Weglikowska, U. and Roth, S., Appl. Phys. Letters 80, 3811 (2002).Google Scholar
2. Hamon, M. A., Chen, J., Hu, H., Chen, Y., Itkis, M. E., Rao, A. M., Eklund, P. C. and Haddon, R. C., Adv. Mater. 11, 834 (1999).Google Scholar
3. Dettlaff-Weglikowska, U., Benoit, J.-M., Chiu, P. W., Graupner, R., Lebedkin, S. and Roth, S., Current Appl. Phys. 2, 497 (2002).Google Scholar
4. Ruangchuay, L., Schwank, J., Sirivat, A., Appl. Surf. Sci. 199, 128 (2002).Google Scholar